Electro Scientific Industries, Inc.

Mark Singer

Leo Benedict Baldwin

Hisashi Matsumoto

Jeffrey Howerton

David Childers

Patrick Leonard

Frank G Evans

A process for laser forming a blind via in at least one layer of a circuit substrate having a plurality of capture pads of varying geometry can include, for at least one blind via to be formed in at least one layer of a circuit substrate, evaluating a capture pad geometry value (such as area and/or volume) within a predetermined distance from a drilling location with respect to a blind via geometry value (such as area and/or volume) to be formed at the drilling location. The process can include setting at least one laser operating parameter based on the evaluation in order to obtain a desired capture pad appearance after blind via formation. The process can include imaging a capture pad area defined as an area within a predetermined distance from a blind via drilling location in at least one layer of a circuit substrate, quantifying at least one appearance value for the imaged capture pad area, and determining an acceptability of the imaged capture pad areas based on the quantified appearance value.

Process and system for quality management and analysis of via drilling

The present invention is operative to determine the angular pose of an assumed object. A series of projection sums are calculated from a sample image of the known object where the known object has an assumed pose. The projection sums are calculated for a range of angles and organized into a two dimensional array coined a projection image. An image of the known object is provided where the known object has an unknown pose. A projection sum is calculated across the image of the known object with the unknown pose preferably at the perpendicular. This projection sum is correlated against the projection image and the angle corresponding to the best correlation is determined to be the angular pose of the known object.

Method and apparatus for determining angular pose of an object

A method and apparatus for characterizing pixels in an image of an object surface by providing at least two images of the surface wherein each pixel has a unique location common to all of the images; comparing each pixel value at each location to an identification matrix; and identifying the region in which each pixel is located based on the comparison. The matrix can comprise a plurality of non-pixel values representing one or more regions, each of the regions defining at least one surface attribute. One embodiment provides at least two references images of a template using the same technique used to obtain each image of the surface, and creating the matrix using the reference images. Providing at least two images comprises providing a first and second image, wherein the surface is illuminated using a first and second source of illumination, or providing the first using a source of illumination and providing the second from the first.

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Tualatin, OR, United States of America

Mark Singer