Lucent Technologies Inc.

Mark Roman Sosinski

Richard Grant Sparber

Kenneth Leon Habegger

Ronald Keith Poole

Karen Louise Moeller

Jaime E Salazar

Apparatus and a method for testing tiered digital multiplexing apparatus. To test a primary train of tiered demultiplexers, a data path assurance train of demultiplexers and a selector is used to generate a demultiplexed signal for comparison with a primary demultiplexed signal. To test a primary train of tiered multiplexers, the output of the final multiplexing stage is connected to the input of the data path assurance train of demultiplexers to generate a demultiplexed signal for comparison with a primary input signal to the primary multiplexer train. Advantageously, a simpler, more reliable, and less expensive data path assurance circuit using the same types of components as the primary multiplexers and demultiplexers can be used to detect failures in these primary units as well as the data path assurance circuit.

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Downers Grove, IL, United States of America

Mark Roman Sosinski