Agere Systems Inc.

Agere Systems Guardian Corp.

Shellback Semiconductor Technology, LLC

Oem Group East, LLC

Mark Nelson

Christian K Forgey

Alexander Trufanov

Johannes Gerardus Ransijn

Curtis James Miller

Robert B Crispell

William Edward Fulmer

Michael J Koziel

Various embodiments for an adjustable flow nozzle system having a manifold with a plurality of adjustable flow nozzles in which the flow rate of each adjustable flow nozzle may be individually adjusted are described herein.

Adjustable flow nozzle system

A sealing package for an integrated circuit chip including a lead structure with first lead members and second lead members. The first lead members are located proximate the corners of the sealing package and have two lead portions external to the sealing package and one lead portion internal to the sealing package. The second lead members are fanned out along the sides of the sealing package and have one lead portion internal to the sealing package and one lead portion external to the sealing package. Each first lead member adapted to provide a connection to ground for at least two sides of the sealing package. Each second lead member adapted to provide a connection between an integrated circuit chip internal to the sealing package and external circuitry.

Lead structure for sealing package

There is disclosed a first stub short bonded across conductive runners of a tuning stub at a distance preferably greater than a distance resulting in the desired frequency of operation of a voltage controlled oscillator tuned by the tuning stub. Thereafter, the voltage controlled oscillator is powered and tested to determine the frequency of operation of the voltage controlled oscillator. The position of a second stub short is determined based on the frequency of oscillation of the oscillator due to the presence of the first stub short, the geometry of the tuning stub and the desired frequency of operation of the voltage controlled oscillator. A second stub short is precisely positioned along the stub using automated equipment, relative to the position of the first stub short, to result in the desired frequency of operation of the voltage controlled oscillator. Depending on the relative positions of the first and second stub shorts relative to the voltage controlled oscillator, the first stub short may be removed. The voltage controlled oscillator may again be powered and tested to confirm the desired frequency of operation of the voltage controlled oscillator.

Automated voltage control oscillator tuning

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Reading, PA, United States of America

Mark Nelson