Hewlett-Packard Company

Mark Morganthaler

Charles E Bryson, Iii

John N Dukes

Lynn Weber

A spectrophotometer optical section is presented which employs a fine positioning beam director which corrects for any deflections of the output beam path and accurately positions the optical beam on the detector slit of the spectrograph. The detector slit is chosen to have a size slightly smaller than the size of the optical beam at the detector slit to have high slit throughput without introducing spurious absorption. The sample cells need not be rigidly mounted thereby enabling use of a sample cell and cell holder which allows quick, easy interchange of cells.

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Palo Alto, CA, United States of America

Mark Morganthaler