Litesentry Corporation

Mark Matthew Abbott

Eric Hegstrom

Douglas Wornson

An apparatus which measures a size and a shape of a transparent sheet includes a conveyor, a lighting apparatus, an imaging device and a process controller. The conveyor moves the transparent sheet. The lighting apparatus projects light onto the transparent sheet. The imaging device receives reflected light reflected from the transparent sheet. A thickness is input into the process controller. A sheet temperature from a sheet temperature sensor and/or a structure temperature from a structure temperature sensor are output to the process controller. An image is output from the imaging device to the process controller. The process controller outputs the size and the shape of the transparent sheet. The outputs from the process controller are used to adjust machine tools used to fabricate the transparent sheet.

Automated online measurement of glass part geometry

An apparatus and methods for the real-time inspection for defects in and on transparent sheets, such as a sheet of glass, are described. A sensor detects a transparent light reflective coating on a transparent sheet and defines a sample profile. An optical inspection system utilizes an illumination source and an imaging device to obtain images of the transparent sheets. An image processing system analyzes for defects in the transparent sheets, including coating defects and defects in edge deleted perimeters. Inspection variables which correspond to the sample profile are used by the optical inspection system and image processing system for real-time inspection.

Apparatus and methods for real-time adaptive inspection for glass production

A method and apparatus for detecting and measuring the optical distortion in pieces of glass and other reflective sheets are disclosed. The method inspects the full length and width of large area glass sheets or multiple sheets comprising a load of glass and uses optical magnification of a reflected circular image of precise size. A plurality of circular images is projected onto the glass and reflect as ellipsoids representative of local surface contours. The major and minor axes of the reflected axis define the axis of greatest magnification and demagnification. Distortions in the glass surface are measured in lens power as localized magnification at the elliptical axis. The angle and magnitude of the minor and major axis of the reflected ellipsoids provide data to map the surface profile of the glass. The method measures distortion of random or periodic frequency and measures distortion in all axes.

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Dundas, MN, United States of America

Mark Matthew Abbott