Government of the United States of America, As Represented by the Secretary of Commerce

Mark L Eickhoff

Peter J Martin

John L Hall

Michael P Winters

A highly accurate in-situ determination of the refractivity of an ambient atmosphere is disclosed, which determination is utilizable to enhance the accuracy of a quantity measurement. The system includes use of a refractometer exposed to an ambient atmosphere and having light directed thereto to form an optical interference fringe pattern having a dependence upon the refractivity of the ambient atmosphere. The fringe pattern is measured as a function of angle either by sequentially scanning a collimated input beam in angle while collecting and detecting the transmitted light, or by imaging (onto a multi-element detector) the angular exit space of the interferometer illuminated with a diverging input beam. The electrical output of the detector is processed to provide an output indicative of the index of refraction of the ambient atmosphere. The determined index of refraction is utilizable to enhance the accuracy of a quantity measurement, such as, for example, the distance measurement provided by a Fabry-Perot or displacement-measuring Michelson interferometer.

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Boulder, CO, United States of America

Mark L Eickhoff