Raytheon Company

Mark J Beaulieu

Craig H McCordic

Michael P Martinez

Brian J Harkins

Craig Richardson

John A Mikutel

An apparatus for testing flatness includes a main fixture defining a longitudinal axis along a direction between a base of the main fixture and a testing end of the main fixture. A gimbal is slidingly engaged to the main fixture to slide in a direction along the longitudinal axis. A biasing member is axially between the base and the gimbal. Three rotating arms are mounted to the testing end of the main fixture. The rotating arms and gimbal are configured to affix a test article in the testing end of the main fixture flat with respect to the three rotating arms to establish a datum plane for flatness testing of the test article.

Flatness testing for cathodes

A radar array assembly is provided, comprising a first chassis and a first vertical stiffener. The first chassis is configured to house a first set of array electronics and a second set of array electronics. The first vertical stiffener is disposed within and operably coupled to the first chassis to enable the first chassis to be resistant to buckling and to define a first cavity in which the first set of array electronics is disposed and a second cavity in which the second set of array electronics is disposed, wherein the first vertical stiffener is configured to be embedded within the first set of array electronics and the second set of array electronics, wherein the first vertical stiffener comprises a first integrated cooling manifold configured to cool both the first set of array electronics and the second set of array electronics.

Growing community of inventors

Sutton, MA, United States of America

Mark J Beaulieu