Springsoft Usa, Inc.

Synopsys, Inc.

Certess, Inc.

Mark Hampton

Joerg Grosse

Jörg Grosse

A method for testing a circuit specification after changing a first version of the circuit specification into a second version of the circuit specification due to a revision of the circuit specification includes receiving a first set of mutations that can be or have been inserted into the first version of the circuit specification and a second set of mutations that can be inserted into the second version of the circuit specification computer program. Changed and unchanged mutations are identified in the first set of mutations and in the second set of mutations based on a comparison between the second version of the circuit specification and against the first version of the circuit specification. Information configured to test the second version of the circuit specification is generated using at least a portion of the identified mutations classified as the changed mutations.

Method for testing a computer program

Methods for testing a computer program after changing a first version of the computer program into a second version of the computer program due to a revision of the computer program are provided. In one aspect, the method includes determining mutations inserted into the first version of the computer program, and the mutations inserted into the second version of the computer program, and comparing the first version of the computer program with the second version of the computer program to determine changed and unchanged mutations in the second version against the first version. The mutations that can be inserted only in the first version of the computer program or only in the second version of the computer program are classified as changed mutations and the mutations that can be inserted in the first and the second version are classified as unchanged mutations.

The disclosure relates to a method for rating the quality of a test program for integrated circuits simulated by means of a computer. The method includes provision of a first file which describes an integrated circuit; simulation of a mutated integrated circuit which is obtained by incorporating mutations into the integrated circuit described in the first file; supplying input values to the mutated integrated circuit and recording of the output values produced for these input values by the mutated integrated circuit; comparison of the output values produced by the mutated integrated circuit with expected values which are provided by the test program, where the expected values have been generated in a reference system; and rating of the quality of the test program on the basis of the comparison results.

Method for evaluating a test program quality

The invention relates to a method for rating the quality of a computer program whose execution involves an integrated circuit's input data and output data being influenced, comprising

Method for evaluating the quality of a computer program

Methods and systems for evaluating computer program tests by mutation analysis, including the execution of mutated programs with the insertion of mutations and the identification of mutated programs which, with a pre-determined test, provide a result identical to a pre-determined result. A series of relevant tests is selected for each mutation from a plurality of tests. A mutation ranking system can be determined with the application of at least a first simplicity criterion to the selected series of tests. The mutated programs are subsequently executed according to the mutation ranking order. Each mutated program is executed with the tests from the associated series of tests. In addition, the method can comprise the programming and activation of a programmable circuit. A ranking system for the tests from a series of tests can be determined with the application of a second simplicity criterion to the tests from said series of tests.

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La Cote St Andre, France

Mark Hampton