Siemens Aktiengesellschaft

Siemens Healthcare Gmbh

Mario Reinwand

Karl Stierstorfer

Steffen Kappler

Daniel Niederlöhner

Christian Schröter

Björn Kreisler

Edgar Göderer

Stefan Wirth

Matthias Strassburg

Peter Hackenschmied

Thilo Hannemann

Miguel Labayen De Inza

Thorsten Ergler

Claus Pohan

Edgar Kraft

Peter Hein

Silke Janssen

Helmut Kropfeld

Fabrice Dierre

Justus Tonn

A method is disclosed for detecting x-rays using an x-ray detector which includes a direct-conversion semiconductor detector element. Additional radiation is supplied to the semiconductor detector element using a radiation source, and the supply of the additional radiation is controlled and/or regulated on the basis of a specified target value. In at least one embodiment, the target value can be specified in a variable manner over time as a sequence of target values. An x-ray detector system is further disclosed, with which the method can be carried out.

Detection of x-rays, and x-ray detector system

A direct conversion X-ray detector for the detection of X-rays includes at least a semiconductor used for detecting X-rays, which has areas that are shaded against X-rays and unshaded areas, a pixelated electrode attached to the semiconductor and an all-over electrode attached to the semiconductor opposite the pixelated electrode, and at least one light source to illuminate the all-over electrode with additional light radiation for the purpose of generating additional charge carriers. In an embodiment, the at least one light source is designed such that the shaded areas are irradiated with a different intensity of the additional light radiation than are the unshaded areas. A CT system including the direct conversion X-ray detector is also disclosed, together with a method for the detection of incident X-rays via direct conversion X-ray detector, wherein the shaded areas are irradiated with a different intensity of the additional light radiation than the unshaded areas.

Direct conversion X-ray detector, CT system, and associated procedure

An embodiment of the invention relates to the use of the spectral composition of X-ray radiation in addition to the intensity thereof in order to determine the attenuation caused by an object. Another aspect of an embodiment of the invention is a device, particularly a radiation monitor for an X-ray or CT system, which is suitable for performing the aforementioned procedure according to an embodiment of the invention.

Method and device for determining the x-ray radiation attenuation caused by the object to be examined

A direct-converting x-ray radiation detector is disclosed for detecting x-ray radiation, in particular for use in a CT system. In an embodiment, the detector includes a semiconductor material used for detecting the x-ray radiation; at least one collimator; and at least one radiation source, to irradiate the semiconductor material with additional radiation. In at least one embodiment, the at least one collimator includes at least one reflection layer on a side facing the semiconductor material, on which the additional radiation is reflected to the semiconductor material. In another embodiment, a CT system including the direct-converting x-ray radiation detector, and a method for detecting incident x-ray radiation via a direct-converting x-ray radiation detector, in particular for use in a CT system, are disclosed.

X-ray radiation detector, CT system and related method

A quantum-counting radiation detector in which signals of individual pixels and signals of combined pixels are evaluated in parallel processing branches and count results are combined in an appropriate manner, thereby reducing the influence of unwanted interference effects for the respective application.

Quantum-counting radiation detector

A shadow mask and method for adjustment are disclosed. The shadow mask may be for an X-ray detector including detector elements, which may further be provided for a computed tomography unit, for example. The shadow mask has a mask plate with holes of which each is assigned a detector element. At least one adjusting hole of the mask plate includes enlarged dimensions in such a way that it is adapted to the dimensions of at least two detector elements. The adjusting hole serves for the method of adjusting the shadow mask over the X-ray detector. Measurement signals of the detector elements that are assigned to the at least one adjusting hole, are determined by using X-radiation. The shadow mask and the X-ray detector are adjusted relative to one another on the basis of a comparison of the measurement signals of the detector elements.

Shadow mask for an X-ray detector, computed tomography unit having a shadow mask, and a method for adjusting a shadow mask

In an x-ray computed tomography apparatus and a method for conducting test measurements therein, a combined phantom is employed that is formed of several individual phantoms, each forming a segment of the combined phantom, and the combined phantom is affixed to a platform of the computed tomography apparatus that is movable with respect to an x-ray data acquisition unit of the computed tomography apparatus. The platform is moved into a first position and a first x-ray absorption distribution of a first segment of the combined phantom is obtained, and the platform is moved into a second position and a second x-ray absorption distribution is obtained of a second segment of the phantom. Movement of the platform and operation of the data acquisition unit for obtaining the first and second x-ray distributions are automatically controlled by a computer program.

Method for conducting a test measurement in a CT apparatus, and CT apparatus

In an X-ray computed tomography apparatus with retrospective beam hardening correction, an overall image of a body slice under examination is determined from overall attenuation values that are obtained from the body slice. At least one partial image that shows essentially only one body substance, such as bone substance, is extracted from this overall image. Attenuation partial values are employed for determining a correction value. The attenuation values are determined for each overall attenuation value from the at least one partial image by re-projection. A correction value is derived from the beam hardening error that is determined for a material combination of two different reference materials.

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Breitbrunn, Germany

Mario Reinwand