Infineon Technologies Ag

Micronas Gmbh

Deutsche Itt Industries Gmbh

Infineon Technologies Austria Ag

Mario Motz

Udo Ausserlechner

Dirk Hammerschmidt

Tobias Werth

Wolfgang Scherr

Bernhard Schaffer

Christof Bodner

Wolfgang Granig

Ulrich Theus

Friedrich Rasbornig

Ferdinand Gastinger

Leneesh Raghavan

Umberto Aracri

Dieter Draxelmayr

Simon Hainz

Benjamin Kollmitzer

Kofi Makinwa

Amirhossein Jouyaeian

Armin Satz

Michael Strasser

Lukas Doerrer

Veikko Summa

Florian Brugger

Francesco Polo

Theodor Kranz

Alessandro Michelutti

Dragos Vocurek

Manfred Bresch

Carlos Humberto Garcia Rojas

Hans Altrichter

Michael Besemann

Volker Strutz

Bernhard Goller

Lothar Blossfeld

Gernot Binder

Martin Mischitz

Peter Slama

Stephan Leisenheimer

Christof Michenthaler

Michael Sorger

Wolfgang Horn

Gerhard Maderbacher

Georg Brasseur

Patrizia Greco

Magdalena Forster

Katharina Schmut

Patrick Torta

Hans-Joerg Wagner

Bernhard Forster

Philemon Schweizer

Konrad Kapser

Hubert Zangl

Massimiliano Zilli

Razvan-Catalin Mialtu

Michael Ortner

Alexander Plautz

Gerhard Pircher

Werner Höllinger

Thomas Bretterklieber

Gert Holler

Johannes Huchzermeier

Guenther Wellenzohn

Diego Lunardini

Gabriel Bonteanu

Qinwen Fan

Yongjia Li

Juergen Niendorf

Simone Reale

Dhananjayee Vijayakrishna

Andrei-George Roman

Gregor Wautischer

Dan Stoica

Riccardo Dapretto

Andrei Gheorghe

Laneesh Raghavan

Christian Kolle

Martin Orasch

Valentin Aldea

Stefan Dineci

Methods and apparatuses for comparing redundant signals in functional safe systems are provided, including methods for mitigating differing signal path delays and for signal weighting of the redundant signals are proposed. An Apparatus includes a first signal path for a first measurement signal of a physical quantity, the first signal path having a first signal propagation delay; a second signal path for a second measurement signal of the physical quantity, the second signal path having a second signal propagation delay different from the first signal propagation delay; a delay compensation circuit configured to compensate for a difference between the first and second signal propagation delays to generate delay-compensated first and second measurement signals; and comparison circuitry configured to compare the delay-compensated first and second measurement signals.

Apparatuses and methods for comparing redundant signals in functional safe systems

A chopper amplifier circuit includes a modulator circuit tuned to a chopper frequency, the modulator circuit being configured, in accordance with the chopper frequency, to convert a voltage into an AC voltage; an amplifier circuit having an inverting input and a non-inverting input for the AC voltage, and having an inverting output and a non-inverting output for providing an amplified AC voltage; and a demodulator circuit tuned to the chopper frequency, the demodulator circuit being configured to convert the amplified AC voltage into an amplified DC voltage. The demodulator circuit is configured to, during different switching phases, couple each of the inverting and non-inverting outputs of the amplifier circuit, both directly and capacitively, to each inverting and non-inverting input of a summing circuit.

Chopper amplifier circuits and method for operating chopper amplifier circuits

An exemplary embodiment of a sensor system includes a magnet system which is designed to generate a magnetic field. Furthermore, the sensor system includes a first magnetic field sensor which is movable in a first direction relative to the magnet system and has a first distance from the magnet system in a second direction perpendicular to the first direction. The sensor system also includes a second magnetic field sensor which is movable in the first direction relative to the magnet system and has a second distance from the magnet system in the second direction, the second distance being greater than the first distance.

Sensor systems, method for determining a position of a magnet system, an operating unit, and a computer program

The present disclosure relates to circuits for detecting a line short circuit and/or a line interruption in a differentially operated line network, comprising at least one control circuit configured to control at least one common-mode signal of the differentially operated line network vis-à-vis a predefined common-mode signal variable and to indicate a line short circuit and/or a line interruption in the differentially operated line network if at least one control or controlled variable of the control circuit exceeds a predefined threshold value.

Circuits and methods for detecting line short circuits and/or line interruptions in differentially operated line networks

The present disclosure relates to chopper amplifier circuits with inherent chopper ripple suppression. Example implementations can realize a doubly utilized chopper amplifier circuit that is a current-saving circuit with a wake-up function that is capable of providing a self-wake signal in order to change into a fast, low-jitter/low-latency mode, and to provide a wake-up signal for a sleeping microprocessor or a system in response to signal changes.

Amplifier circuits and method for operating amplifier circuits

The described techniques address issues associated with hybrid current or magnetic field sensors used to detect both low- and high-frequency magnetic field components. The hybrid sensor implements a DC component rejection path in the high-frequency magnetic field component path. Both digital and analog implementations are provided, each functioning to generate a DC component cancellation signal to at least partially cancel a DC component of a current signal generated via the high-frequency magnetic field component path. The hybrid sensor provides a high-bandwidth, high-accuracy, and low DC offset hybrid current solution that also eliminates the need for DC decoupling capacitors in the high-frequency path. A modification is also described for implementing a Sigma-Delta (ΣΔ) quantization noise reduction path to reduce the quantization noise and to improve accuracy.

Hybrid high-bandwidth magnetic field sensor

A stress sensor includes a semiconductor substrate with a first transistor arrangement and a second transistor arrangement. The first transistor arrangement includes a first transistor with a first source-drain channel region and a second transistor with a second source-drain channel region. The first transistor and the second transistor are aligned relative to each other such that the current flow directions in the first and the second source-drain channel regions are opposite to each other. The second transistor arrangement includes a third transistor with a third source-drain channel region and a fourth transistor with a fourth source-drain channel region. The third transistor and the fourth transistor are aligned relative to each other such that the current flow directions in the third and the fourth source-drain channel regions are opposite to each other. The stress sensor generates a gradient-compensated output signal used to determine a mechanical stress acting on the semiconductor substrate.

Transistor-based stress sensor and method for determining a gradient-compensated mechanical stress component

A device comprises a magnet and an angle sensor, wherein the angle sensor is configured to detect a rotation angle of the magnet. The device also contains a rotation counter, wherein the rotation counter is configured to record a number of rotations of the magnet. The angle sensor and the rotation counter are implemented in physically separate components.

Devices having a turn counter and associated production methods

A device may determine a sensor identifier corresponding to a sensor integrated circuit (IC) associated with a sensor system. The device may provide the sensor identifier corresponding to the sensor IC. The device may receive, based on providing the sensor identifier, compensation parameter information associated with the sensor IC. The device may cause a set of compensation parameters, associated with the compensation parameter information, to be stored on a controller associated with the sensor system. The set of compensation parameters may include one or more parameters associated with correcting a measurement performed by the sensor IC or a safety result provided by the sensor IC.

Providing compensation parameters for sensor integrated circuits

Magnetic field sensor apparatuses are discussed. A magnetic field sensor apparatus in accordance with one example implementation in this case comprises a coil and a magnetic field sensor. A chip carrying the coil and the magnetic field sensor is arranged on a leadframe. The leadframe comprises a cutout.

Magnetic field sensor apparatus

Systems and methods are provided for which a chopper modulator and a chopper demodulator of a chopped apparatus having a variable chopper frequency are described. A feedback path is used to reduce ripples and/or remaining offsets as a result of the variable chopper frequency.

Chopper system and method

The subject matter described herein relates to a semiconductor circuit arrangement with a semiconductor substrate with an integrated Hall sensor circuit. During a first clock phase PHa first electrical voltage signal ±V(PH) or ±V(PH) can be generated in the Hall effect region that has a first dependency on a mechanical stress of the semiconductor substrate. During a second clock phase PHa second electrical voltage signal ±V(PH) or ±V(PH) can be generated in the Hall effect region that has a second dependency on a mechanical stress of the semiconductor substrate. The semiconductor circuit arrangement is designed to ascertain a specific mechanical stress component based on a combination of the first electrical voltage signal ±V(PH) or ±V(PH) and of the second electrical voltage signal ±V(PH) or ±V(PH).

Device and method for ascertaining a mechanical stress component by means of a hall sensor circuit

A bandgap reference circuit includes a bandgap reference core circuit that includes a first bipolar transistor having a first emitter current density and a first base-emitter voltage, a second bipolar transistor having a second emitter current density that is smaller than the first emitter current density and having a second base-emitter voltage, a resistor that is connected to the emitter of the second bipolar transistor, and a differential amplifier circuit that is configured to control first and second emitter currents through the first and second bipolar transistors, respectively, such that a sum of the second base-emitter voltage and a voltage drop across the resistor approximates the first base-emitter voltage. The bandgap reference circuit further includes a first replica bipolar transistor that emulates an operating point of the first bipolar transistor and a second replica bipolar transistor that emulates an operating point of the second bipolar transistor.

Bandgap reference circuit

The described techniques address issues associated with hybrid current or magnetic field sensors used to detect both low- and high-frequency magnetic field components. The hybrid sensor implements a DC component rejection path in the high-frequency magnetic field component path. Both digital and analog implementations are provided, each functioning to generate a DC component cancellation signal to at least partially cancel a DC component of a current signal generated via the high-frequency magnetic field component path. The hybrid sensor provides a high-bandwidth, high-accuracy, and low DC offset hybrid current solution that also eliminates the need for DC decoupling capacitors in the high-frequency path. A modification is also described for implementing a Sigma-Delta (&#x3a3;&#x394;) quantization noise reduction path to reduce the quantization noise and to improve accuracy.

Apparatuses and methods for analog-digital conversion and corresponding systems having a sensor and an apparatus of this type are provided. Demodulation is executed with no variable preamplification, followed by continuous-time analog-digital conversion, at least in time segments, which further employs chopper techniques.

Analog-digital converter apparatus, sensor system and method for analog-digital conversion

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Wernberg, Austria

Mario Motz