Concept Laser Gmbh

Cl Schutzrechtsverwaltungs Gmbh

Marie-Christin Ebert

Tobias Bokkes

Philipp Schumann

Florian Bechmann

Fabian Zeulner

Tim Klaußner

Frank Herzog

Jens Stammberger

Christian Diller

Stephan Hunze

Tim Döhler

Alexandra Popp

Martin Wachter

Werner Jürgen

Bechmann Florian

Apparatus () for additively manufacturing three-dimensional objects () by means of successive layerwise selective irradiation and consolidation of layers of a build material () which can be consolidated by means of at least one energy beam (), which apparatus () comprises an irradiation device () with at least one beam guiding element () on which the energy beam () is partially reflected, wherein a first beam part () extends between the beam guiding element () and a build plane () of the apparatus () and a second beam part () is transmitted through or scattered at the beam guiding element (), wherein a determination device () is provided that is adapted to determine at least one parameter of the second beam part ().

Apparatus for additively manufacturing three-dimensional objects

Method for calibrating at least one apparatus () for additively manufacturing three-dimensional objects by means of successive layerwise selective irradiation and consolidation of layers of a build material which can be consolidated by means of an energy beam that can be generated via an irradiation element of an irradiation device () of the apparatus (), wherein a determination unit () is provided for determining at least one parameter of radiation () inside a process chamber (), wherein a calibration beam source () is arranged or generated inside the process chamber () of the apparatus (), in particular in a build plane () or a region above the build plane (), wherein at least one parameter, in particular the intensity, of radiation () emitted by the calibration beam source () is determined via the determination unit ().

Method for calibrating at least one apparatus for additively manufacturing three-dimensional objects

An apparatus for additively manufacturing three-dimensional objects may include a first detection device configured to detect a first process parameter during operation of the apparatus, and to generate a first data set comprising information relating to the first process parameter, a second detection device configured to detect a second process parameter during operation of the apparatus, and to generate a second data set comprising information relating to the second process parameter; and a data processing device configured to determine a mutual dependency between the first process parameter and the second process parameter based at least in part on the first data set and the second data set. The mutual dependency may include a possible influence or a real influence of the first process parameter on the second process parameter. The first process parameter may include a chemical parameter and/or a physical parameter of an atmosphere within a process chamber of the apparatus. The second process parameter may include a chemical parameter, a geometrical parameter, and/or a physical parameter of build material during operation of the apparatus.

An apparatus () for manufacturing of three-dimensional objects (), especially SLM or SLS apparatuses (selective laser melting apparatus or selective laser sintering apparatus), significantly comprising a construction room () arranged in a housing () of the apparatus ().

Apparatus for manufacturing of three-dimensional objects

Apparatus () for additively manufacturing three-dimensional objects () by successive layerwise selective irradiation and consolidation of layers of a build material () which can be consolidated by means of an energy beam (), the apparatus comprising: a first detection device () adapted to detect at least one first process parameter (P), particularly during operation of the apparatus (), and to generate a first data set (DS) comprising information relating to the detected first process parameter (P); at least one second detection device () adapted to detect at least one second process parameter (P), particularly during operation of the apparatus (), and to generate at least one second data set (DS) comprising information relating to the detected second process parameter (P); a data processing device () adapted to link the first data set (DS) with the at least one second data set (DS).

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Coburg, Germany

Marie-Christin Ebert