Micron Technology Incorporated

Mariano Eduardo Burich

Mustafa Nazmi Kaynak

Sivagnanam Parthasarathy

Dung Viet Nguyen

Phong Sy Nguyen

Eyal En Gad

A soft input is obtained from a sense word corresponding to encoded host data read from the memory device and decoded using a parity-check matrix. A match array is maintained. Each iteration of an error correcting code operation a number of unsatisfied check nodes of a respective bit of the sense word is calculated for each bit of the sense word. A bit flip threshold from a threshold data structure is obtained based on a current iteration of the error correcting code operation, a soft bit associated with the respective bit, and a match bit associated with the respective bit. The respective bit is flipped based on the number of unsatisfied check nodes satisfying the bit flip threshold.

Dynamic bit flip thresholds based on soft bit and match bit

A codeword is received and stored in a first data structure to be decoded by flipping one or more of a plurality of bits over multiple iterations by a bit flip decoder, an error check is executed on the codeword, by a controller, to identify error bits from the plurality of bits, and the state of an error bit is flipped from one of the identified error bits if parity check (PC) violations associated with the error bit meet or exceed a PC violation threshold associated with a bit flip state of the error bit, where the bit flip state is selected from one of a first bit flip state with a first PC violation threshold and a second bit flip state with a second PC violation threshold different than the first PC violation threshold. The current state of the error bit is stored in a second data structure.

Growing community of inventors

San Diego, CA, United States of America

Mariano Eduardo Burich