Carl Zeiss Microscopy Gmbh

Carl Zeiss Jena Gmbh

Marcus Heidkamp

Peter Klopfleisch

Bryce Anton Moffat

Dirk Doering

Alexander Gratzke

Axel Krause

Stephan Wagner-Conrad

Klaus Weisshart

An illumination apparatus includes a first solid-state-based illumination module, a second solid-state-based illumination module, and a superposition unit, which couples first and the second luminescence radiation into an illumination beam path, in which said radiation is guided up to the end of the illumination beam path in order to illuminate a light modulator. A filter unit which filters light with a second color from the first luminescence radiation with a first color and from the second luminescence radiation such that light with the first and second color is present at the end of the illumination beam path.

Illumination device for a projector having a light modulator

The invention is directed to a method and an arrangement for displaying residual errors of a function which is fitted to a set of points. In the prior art, the residual errors are displayed in a separate graph apart from the function graph so that it is difficult for an observer to discern the quality of the fit of the function to the data points. An improved method and an improved arrangement make it possible to visually assess the quality of the fit in a simple, accurate manner. According to the invention, visual codes are assigned to the fitted function or to the data points of the point set piecewise or pointwise depending on the residual errors, and the fitted function is displayed graphically at an interface, wherein the fitted function is displayed piecewise or pointwise in the form of the assigned visual codes. The invention is preferably used for raster image spectroscopy with laser scanning microscopes.

Method and arrangement for outputting residual errors for a function customized to a set of points

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Jena, Germany

Marcus Heidkamp