Leica Microsystems Cms Gmbh

Marcus Dyba

Hilmar Gugel

Volker Seyfried

Holger Birk

Bernd Widzgowski

Jonas Foelling

Roland Seifert

Jonas Fölling

Manuel Kremer

Arnold Giske

Jochen Sieber

A single-particle localization microscope, including an optical system configured to illuminate a sample region with a sequence of light patterns having spatially different distributions of illumination light adapted to cause a single particle located in the sample region to emit detection light, a detector configured to detect a sequence of intensities of the detection light emerging from the sample region in response to the sequence of illuminating light patterns, and a processor configured to determine, based on the sequence of intensities of the detection light, an arrangement of potential positions for locating the particle. The processor further illuminates the sample region with at least one subsequent light pattern, causes detection of at least one subsequent intensity, and decides, based on the at least one subsequent intensity of the detection light, which one of the multiple potential positions represents an actual position of the particle in the sample region.

Single-particle localization microscope

An image processing system, includes a processor, wherein the processor is configured to obtain image pixel data generated by an optical imaging system of a microscope, to perform deconvolution processing on the obtained image pixel data for generating deconvolved image pixel data, to perform denoising processing on the obtained image pixel data for generating denoised image pixel data, to obtain a sampling density based on which the image pixel data is generated by the optical imaging system, and to mix the deconvolved image pixel data and the denoised image pixel data for generating mixed image pixel data with a weighting dependent on the sampling density to change a ratio of the deconvolved image pixel data in relation to the denoised image pixel data when the sampling density exceeds an oversampling limit.

Image processing system

A scanning device for scanning an object in a scanning microscope includes at least one scanning unit configured to two-dimensionally scan the object using a light beam. The scanning unit includes at least one deflection element configured to deflect a light beam impinging thereon. The deflection element is rotationally symmetric in shape. At least one rotation device is configured to rotate the scanning unit about an axis of rotation so as to allow for image field rotation.

Scanning device for scanning an object for use in a scanning microscope

A device for detecting light includes a silicon photomultiplier (SiPM) comprising a detection area formed from an array of a plurality of single-photon avalanche diodes (SPADs). An optical system is configured to shape the light such that the detection area is covered as completely as possible with a light beam region of substantially constant intensity.

Device and method for detecting light using a silicon photomultiplier and flat-top optical system

A method for improving dynamic range of a device for detecting light includes providing at least two detection regions. The detection regions are each formed by an array of a plurality of single-photon avalanche diodes (SPADs) and the detection regions each comprise at least one signal output. A characteristic curve is determined for each of the detection regions. The characteristic curves are combined with one another and/or offset against one another in order to obtain a correction curve and/or a correction factor.

Method for improving the dynamic range of a device for detecting light

A method for light-microscopy imaging of a sample structure () is described, having the following steps:

Method and device for light-microscopic imaging of a sample structure

A device and a method for acquiring a microscopic image of a sample structure are described. An optic for imaging the sample structure and a reference structure is provided, as well as a drift sensing unit for sensing a drift of the sample structure relative to the optic on the basis of the imaged reference structure. The optic comprises a first sharpness plane for imaging the sample structure and at the same time a second sharpness plane, modifiable in location relative to the first sharpness plane, for imaging the reference structure.

Device and method for acquiring a microscopic image of a sample structure

A microscopic device provides three-dimensional localization of point-like objects and includes two imaging optics, each configured to image a same point-like object located in an object space into two separate image spaces as a focused light distribution. Two detector units are respectively associated with the imaging optics and configured to capture an analyzable light spot in detection points of a detection surface disposed in the respective image space. Each imaging optics includes an optical device that orients the focused light distributions obliquely to a detection axis such that, taking into account the detection point correspondence, the two light spots shift in opposite directions based on a z-position of the point-like object. An evaluation unit brings the detection points of the two detection surfaces into mutual pairwise correspondence and analyzes the two light spots so as to ascertain a lateral x-y position and an axial z-position of the point-like object.

Microscopic device and microscopic method for the three-dimensional localization of point-like objects

An optical device includes: a focusing optic that focuses a light beam in a focal plane; at least two phase filters for selectively focusing the light beam and effecting a phase shift of the light beam; and a filter wheel supporting the at least two phase filters which are individually introducible along an optical axis of the light beam, where the filter wheel is rotationally adjusted in relation to the optical axis by a stepper motor and linearly adjusted in an r-direction along a plane of the filter wheel by a linear adjustment mechanism.

Phase filters for a scanning microscope

A sample retainer for a microscope is described, comprising a sample stage (), a holder () arranged on the sample stage (), a sample carrier (), couplable to the holder (), to which a sample is attachable, and an adjusting apparatus (), engaging on the holder (), with which with the sample carrier (), together with the holder () to which the sample carrier () is coupled, is displaceable on the sample stage (), relative to the objective (), into a target position. A decoupling apparatus that decouples the sample carrier (), arranged in the target position, from the holder () upon imaging of the sample through the objective () is provided.

Sample holder for a microscope

A method and a device for providing a predeterminable concentration of at least one component in a microscopic sample liquid medium are described. The device includes a feeding device for the at least one component. Measurement data are determined, measuring a predeterminable parameter using a microscopic method. The concentration of the at least one component is adjusted or controlled via the feeding device based on the basis of measurement data.

Device and method for providing a predeterminable concentration of at least one component in a liquid medium

A device for beam adjustment in an optical beam path, having at least two mutually independent light sources providing respective beams of a high or extremely high resolution microscope, the beams of the light sources superposed in a common illumination beam path. The device includes a calibration sample with the aid of which the pupil position and/or focal position of the beams can be checked. The device also includes a sample holder arranged to bring the calibration sample into and out of the common illumination beam path at the site or in the vicinity of an intermediate image. A corresponding method is described. In accordance with the device and method, it is possible to undertake the beam adjustment independently of the actual use, that is to say, in the case of a high resolution microscope, independently of the examination sample and/or the recording of images.

Device and method for beam adjustment in an optical beam path

The invention proposes a method for imaging at least one microscopic property of a sample and an apparatus with which the proposed method can be carried out. In the method, at least one coherent illumination light with at least one illumination wavelength is produced by means of at least one light source. The illumination light is imaged onto at least one region on or within the sample. Detection light emitted by the sample is split at least partially into incoherent detection light and into coherent detection light by means of at least on physically separating beam splitter. The coherent detection light is at least partially separated from the coherent illumination light by at least one beam-splitter element. The coherent detection light is detected. The proposed method can be used in particular for investigating the sample by means of coherent anti-Stokes-Raman scattering.

Laser microscope with a physically separating beam splitter

A method and a microscope, in particular a laser scanning fluorescence microscope, for high spatial resolution examination of samples, the sample () to be examined comprising a substance that can be repeatedly converted from a first state (Z, A) into a second state (Z, B), the first and the second states (Z, A; Z, B) differing from one another in at least one optical property, comprising the steps that the substance in a sample region (P) to be recorded is firstly brought into the first state (Z, A), and that the second state (Z, B) is induced by means of an optical signal (), spatially delimited subregions being specifically excluded within the sample region (P) to be recorded, are defined in that the optical signal () is provided in such a way that a standing wave with defined intensity zero points () is formed in the sample region (P) to be recorded.

Method and microscope for high spatial resolution examination of samples

A method for high spatial resolution examination of a sample, the sample to be examined including a substance that can be repeatedly converted from a first state into a second state, the first and the second states differing from one another in at least one optical property. The method includes: a) bringing the substance into the first state by means of a switching signal in a sample region to be recorded, b)inducing the second state by means of an optical signal, spatially delimited subregions being specifically excluded within the sample region to be recorded, c) reading out the remaining first states, and d) steps a) to c) are repeated, the optical signal being displaced upon each repetition in order to scan the sample, wherein the individual steps a) to d) are carried out in a sequence adapted to the respective measuring situation.

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Heidelberg, Germany

Marcus Dyba