Thermo Fisher Scientific Gmbh

Other

Fei Comapny

Thermo Keytek LLC

Marcos Hernandez

Carl Rosenblatt

Enrique L Riveros

Electrostatic discharge (ESD) test systems include a FET-based pulse generator using pairs of back-to-back FETs coupled to produce an ESD pulse based on discharging a capacitor that is coupled in series with a device under test (DUT). A number of FETs can be selected based on an intended ESD test voltage magnitude.

Solid state ESD SiC simulator

A method and apparatus for non-intrusively measuring flowing currents and/or voltage on the inner conductor of a coaxial cable is introduced herein. In particular, a resultant low-impedance element is coupled concentrically to the shield at a desired insertion point of the coaxial cable. A pair of conductive leads provided by the resultant low-impedance element is thereafter monitored for derived flowing currents that are in direct proportion to but of opposite polarity to the current within the inner conductor of the coaxial cable.

Low-side coaxial current probe

Encapsulated switches are disclosed which substitute non-toxic gallium alloy for mercury. In one embodiment, wetting of the interior surfaces of the housing is prevented by coating the surfaces with an electrically insulative inorganic non-metallic material, such as alumina or boron nitrate. According to another embodiment, a perfluorocarbon liquid is employed as the anti-wetting agent.

Method of manufacture of encapsulated gallium alloy containing switch

A system, probe interface, and method to test an integrated circuit with an electrostatic discharge signal. The probe interface includes a pulse generation circuit, ground plane, and a relay matrix, while the integrated circuit includes a plurality of contact points. The probe interface is configured proximate to the integrated circuit and the relay matrix is configured to electrically connect at least one of an operative signal, the pulse generation circuit, or the ground plane to a contact point of the integrated circuit. The probe interface is thus configured to provide a shortened path for at least one of the electrostatic discharge signal from the probe interface to the integrated circuit, or to the ground plane from the integrated circuit. The probe interface may selectively electrically connect to up to about thirty-two contact points of the integrated circuit, while the system may include up to about four probe interfaces.

Probe interface for electrostatic discharge testing of an integrated circuit

Encapsulated switches employing mercury substitute and methods of manufacture thereof

The present invention relates to a swimsuit comprising swimming trunks, a compressed gas cylinder with a user-operated valve, and one or more inflatable bladders attached to the swimming trunks. The swimsuit, apart from its basic function as clothing, performs simultaneously as a protecting and rescuing device in a life-threatening situation.

Inflatable swimsuit

A circuit arrangement, system, and method to test a device with a plurality of pins for electric overstress and transient induced latch-up characteristics. The circuit arrangement includes an inverting operational amplifier with a unity gain to receive a triggering signal and supply an inverted signal to a power amplifier. The power amplifier transforms the inverted signal into a test signal, which is received by a ratio circuit. The test signal is further operable to test the electric overstress and transient induced latch-up characteristics of the device. The ratio circuit transforms the test signal into a ratio signal. The ratio signal has a voltage magnitude that corresponds to the current magnitude of the test signal. The test signal and ratio signal are measured to determine if, during testing, the device or a component of the device has failed.

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San Jose, CA, United States of America

Marcos Hernandez