Other

Micron Technology Incorporated

Marco Roveda

Demetrio Pellicone

Adamo Corsi

Rino Micheloni

Stefano Ghezzi

Irene Babudri

Romina Zonca

Stefano Saltutti

Giuseppe Maurizio Lorusso

Luigi Costanzo

Concetta Di Tuoro

Daniela Ruggeri

Procolo Carannante

Laura Sartori

Davide Villa

Gianfranco Ferrante

A memory architecture includes a memory including a Command Set, and a serial peripheral interface (SPI) for connecting the memory to a generic host device. The SPI includes a data in line for supplying output data from the host device to inputs of the memory; a data out line for supplying output data from the memory to input of the host device; a clock line driven by the host device; and an enable line that allows the memory to be turned on and off by the host device. The memory is a NAND Flash Memory. The SPI includes an I/O registers block, including an SPI label register and a data register for driving separately data, commands and addresses directed to the memory from the corresponding SPI label registers.

Memory architecture with serial peripheral interface

A removable storage device includes a substrate whereon a plurality of components are arranged. Advantageously, the removable storage device comprises a casing of the package type suitable to completely cover these components and to form, together with the substrate, an external coating of the removable storage device. Moreover, a method is described for assembling at least one removable storage device thus realized.

Removable data storage device and related assembling method

A method of managing fails in a non-volatile memory device including an array of cells grouped in blocks of data storage cells includes defining in the array a first subset of user addressable blocks of cells, and a second subset of redundancy blocks of cells. A third subset of non-user addressable blocks of cells is defined in the array for storing the bad block address table of respective codes in an addressable page of cells of a block of the third subset. Each page of the third subset is associated to a corresponding redundancy block. If during the working life of the memory device a block of cells previously judged good in a test phase becomes failed, each block is marked as bad and the stored table in the random access memory is updated.

Method of managing fails in a non-volatile memory device and relative memory device

A boot method for a data control unit downloads boot information from a nonvolatile memory into a temporary buffer of a boot-activation unit. A processing unit is activated by the boot-activation unit; a boot code is executed by the processing unit; and an operating code is downloaded from the nonvolatile memory into a volatile memory through the boot-activation unit. To correct possible errors in the block of the nonvolatile memory containing information and boot codes, the boot-activation unit verifies whether the boot information downloaded into its volatile memory has a critical-error condition and activates a spare memory portion of the nonvolatile memory in presence of the critical-error condition.

Data control unit capable of correcting boot errors, and corresponding self-correction method

Growing community of inventors

Motta Visconti, Italy

Marco Roveda