Lam Research Corporation

Marco Piccigallo

Richard M Blank

Arulselvam Simon Jeyapalan

Peter S Thaulad

Mark E Emerson

Hossein Sadeghi

Eric Chan

Disclosed are techniques and systems for automatically determining and correcting the levelness of a wafer handling robot end effector. The systems may use a tilt sensor or a gravitational field sensor which may be calibrated to the wafer handling robot. The output from the tilt sensor may be used to determine or estimate the tilt of an end effector of the wafer handling robot and to perform correctional positioning to reduce or eliminate the tilt, to automatically teach certain positions that have reduced tilt, to perform health checks on the robot, provide feedback to a user, etc.

Wafer handling robot with gravitational field sensor

Systems and techniques for determining and using multiple types of offsets for providing wafers to a wafer support of a wafer station of a semiconductor processing tool are disclosed; such techniques and systems may use an autocalibration wafer that may include a plurality of sensors, including a plurality of edge-located imaging sensors that may be used to image fiducials associated with two different structures located in a selected wafer station.

Integrated adaptive positioning systems and routines for automated wafer-handling robot teach and health check

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Livermore, CA, United States of America

Marco Piccigallo