Siemens Industry Software Gmbh

Marcin Hlond

Gajinder Singh Panesar

A method of monitoring messages from a sensor using an integrated circuit is provided. The messages include data measured by that sensor. The method includes reading a first message from interconnect circuitry of the integrated circuit. The interconnect circuitry connects the sensor to one or more core devices configured to process the messages. A first hash value is calculated for the first message. The first hash value is compared to one or more prior hash values stored in a hash store. Each prior hash value of the one or more prior hash values corresponds to a message that was read from the interconnect circuitry prior to the first message. A corrective action is performed when a difference between the first hash value and at least one of the prior hash values stored in the hash store is below a predetermined threshold.

Hardware-based sensor analysis

A method of detecting anomalous latencies in communications between components on an integrated circuit (IC) chip. The method includes: (i) monitoring communications between a first component of the IC chip and other components of the IC chip, each communication comprising a command sent from the first component to another component, and a response received by the first component from that other component, the monitoring comprising: measuring the number of communications in each of a series of monitored time windows, and measuring the latency of each communication in the series of monitored time windows; (ii) calculating a maximum tolerable latency for each operational time window of the first component from the number of communications in that operational time window, an available stall time of the first component in that operational time window, and a latency penalty factor for that operational time window; and (iii) determining a measured latency to be anomalous if the measured latency is greater than the maximum tolerable latency.

Detecting anomalous latent communications in an integrated circuit chip

A method of identifying a cause of an anomalous feature measured from system circuitry on an integrated circuit (IC) chip, the IC chip comprising the system circuitry and monitoring circuitry for monitoring the system circuitry by measuring features of the system circuitry in each window of a series of windows, the method comprising: (i) from a set of windows prior to the anomalous window comprising the anomalous feature, identifying a candidate window set in which to search for the cause of the anomalous feature; (ii) for each of the measured features of the system circuitry: (a) calculating a first feature probability distribution of that measured feature for the candidate window set; (b) calculating a second feature probability distribution of that measured feature for window(s) not in the candidate window set; (c) comparing the first and second feature probability distributions; and (d) identifying that measured feature in the timeframe of the candidate window set as a cause of the anomalous feature if the first and second feature probability distributions differ by more than a threshold value; (iii) iterating steps (i) and (ii) for further candidate window sets from the set of windows prior to the anomalous window; and (iv) outputting a signal indicating those measured feature(s) of step (ii)(d) identified as a cause of the anomalous feature.

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Cambridge, United Kingdom

Marcin Hlond