Telefonaktiebolaget Lm Ericsson (publ)

Marcello Morchio

Roberto Magri

Paolo Debenedetti

Stefano Orsi

Annamaria Fulignoli

Giorgio Andreoli Armanni

Marina Valeri

Alfredo Palagi

A method of identifying a fault in an optical link comprises continually storing samples of a signal that represents a power of an optical signal received over the optical link. When a fault is detected on said optical link, at least one stored series of samples of the signal is retrieved. The method then comprises performing a classification on the retrieved series of samples, in order to classify the series of samples as resulting from one of a plurality of predefined faults.

Fault classification

In order to predict properties of a first device, data is obtained relating to properties of second devices having characteristics in common with the first device. The data comprises values of a first parameter at specific values of a second parameter. The data is organized in a first matrix with each row or column representing one value of the second parameter, and each column or row contains for one of the second devices the value of the first parameter at each of the values of the second parameter for which data is available. The first matrix is factorized into a second matrix and a third matrix. The second matrix represents a relationship between the second parameter and hidden features. The third matrix represents a relationship between the second devices and hidden features. The second matrix and/or the third matrix is used to predict at least one value of the first parameter and at least one respective specific value of the second parameter outside a predetermined range.

Prediction of device properties

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Genoa, Italy

Marcello Morchio