Keysight Technologies, Inc.

Marcel Zeiler

Bernd Nebendahl

An apparatus for determining a wavelength and a power of an input signal is described. The apparatus comprises a memory which stores instructions, which when executed by the processor, cause the processor to: recover a first phase for a first Mach-Zehnder Interferometer MZI; recover a second phase for a second MZI; subtract the first phase from the second phase to provide a phase difference; determine an unwrapped phase difference as a function of wavelength; determine a coarse wavelength; and determine a first wavelength for the first FSR and a second wavelength from the second FSR; and average the first and second wavelengths to determine the wavelength of the input signal.

Optical wavemeter

An optical device having a wavelength measurement section and an SMRS measurement section is disclosed. The wavelength measurement section includes a MZI, which includes first optical waveguides having a first optical path length difference. The wavelength measurement section also includes a second MZI, which includes second optical waveguides having a second optical path length difference. The second optical path length difference is greater than the first optical path length difference. The SMRS includes a filter adapted to suppress a primary laser mode of the second output optical signal and to pass a remaining portion of the second output signal to determine an SMRS based on an optical power of the main laser mode from the wavelength and power measurement stage, and an optical power of the remaining portion of the second output optical signal.

A photonic integrated circuit (PIC) for determining a wavelength of an input signal is disclosed. The PIC comprises: a substrate; a first Mach-Zehnder Interferometer (MZI) disposed over the substrate, comprising first optical waveguides having a first optical path length difference, and configured to receive a first output optical signal from a light source. The PIC also comprises a second Mach-Zehnder Interferometer (MZI) disposed over the substrate, comprising second optical waveguides having a second optical path length difference, which is greater than the first optical path length difference, and configured to receive a second output optical signal from the light source.

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Boeblingen, Germany

Marcel Zeiler