Koninklijke Philips Corporation N.V.

Marcel Schouten

Ype Bernardus Brada

Maurits Koenen

Michel Van Es

Nikolaj Vasiljevitsj Zjiroecha

Mark Johannes Lelieveld

Chuen Yu Cyrus Pang

A device for measuring hair properties has a first part (I) and a second part (II) between which hair (H) is guided. The first part includes a measuring probe (MP), and the second part is arranged for deforming the hair against the measuring probe. While the device moves along the hair, the measuring probe experiences both a friction force resulting from the hair being guided along the measuring probe, and a deformation force resulting from hair deformation by the second part against the measuring probe. The second part includes a pressure element (PB, S) for pressing the hair against the measuring probe. In alternative embodiments, the second part comprises alignment elements (AE) at opposite sides of the measuring probe, and guidance elements (G) for mitigating an influence of an angle at which the device is applied to the hair to the friction force and/or the deformation force.

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Hoogezand, Netherlands

Marcel Schouten