Carl Zeiss Ag

Marc Tremont

Bernd Spruck

Frank Hoeller

Cristina Alvarez Diez

Frank Höller

A device for determining a position of an object () in a spatial region () comprises a light source (), a light directing device (-), at least one reference signal detector () and a detector arrangement (). The light source () generates a sequence of light pulses with a repetition rate. The light directing device (-) directs the sequence of light pulses into the spatial region () and, as a reference signal (), to the at least one reference signal detector (). The detector arrangement () detects a plurality of light signals () which are reflected and/or scattered by the object () in the spatial region () into a plurality of different directions by reflection and/or scattering of the sequence of light pulses. The evaluation circuit () is coupled to the detector arrangement () and the at least one reference signal detector () and determines a phase difference () between the reference signal () and a signal component of at least one light signal (). The phase difference is determined based on the signal component which has a frequency that corresponds to a multiple of the repetition rate.

Method and device for determining a position of an object

A device for measuring a surface () comprises a light source (), a light directing device (-), a detector arrangement () and an evaluation circuit (). The light source () generates a sequence of light pulses with a repetition rate. The light directing device (-) is controllable to direct the sequence of light pulses onto a surface area () of the surface (). The surface area may be selected from plural surface areas (). The detector arrangement is configured to receive at least one light signal (-) scattered and/or reflected by the surface area (). The evaluation circuit () is coupled to the detector arrangement () and is configured to determine a phase difference between a reference signal () derived from the sequence of light pulses and a signal component of the at least one light signal (-), in order to determine a position of the surface area (). In doing so, the phase difference is determined for the signal component which has a frequency corresponding to a multiple of the repetition rate.

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Schorndorf, Germany

Marc Tremont