Sgs-thomson Microelectronics Limited

Siemens Automotive S.a.

Sgs-microelectronics S.a.

Marc Simon

Domenico Rossi

Antoine Pavlin

Carlo Cini

Thierry Sicard

A circuit for measuring current in a power MOS transistor (M0) comprises second (M1) and third (M2) transistors in series of the same type and same technology as, but having a smaller surface than, the power transistor and arranged in parallel on the latter. The two series transistors have their gates connected to the gate of the power transistor. The current in transistor (M2) which is connected to the reference electrode of the power transistor is measured.

Circuit for measuring current in a power MOS transistor

A dynamic isolation circuit belonging to a monolithic integrated circuit comprising lateral transistors and vertical transistors. The lateral transistors are isolated by an isolating region connected to an isolating potential (V.sub.iso), these lateral transistors being connected up to voltages of a first polarity relative to a reference voltage (GND), the power terminal connected up to the rear face normally being at a potential (V.sub.out) of the first polarity relative to the reference voltage. This circuit comprises a sign-detector (D) for detecting the sign of the potential of the rear face relative to the reference voltage, at least one lateral transistor (S1) to connect the isolating potential to the reference potential when the potential of the rear face is of the first polarity relative to the reference potential, and at least one vertical transistor (S2) to connect the isolating potential to the potential of the rear face when the potential of the rear face is of the second polarity relative to the reference potential.

Circuit for dynamic isolation of integrated circuits

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Tournefeuille, France

Marc Simon