Teradyne, Inc.

Cenrad, Inc.

Marc LeSueur Smith

Philip Luke Campbell

Brian S Merrow

Eric Lenhart Truebenbach

John P Toscano

Jianfa Pei

David Paul Bowyer

Christopher J Bruno

Adnan Khalid

Mark S O'Brien

Fadi H Daou

Jerry Valdez

An example test system includes a tray to hold devices, where the devices include devices to be tested or devices that have been tested; a motor that is controllable to cause vibrations; and a component that couples the motor to the tray to cause the tray to vibrate in response to the vibrations of the motor.

Using vibrations to position devices in a test system

An example test system includes a test carrier to hold devices for test; a device shuttle to transport the devices; and a robot to move the devices between the test carrier and the device shuttle. The device shuttle is configured to move, towards a stage of the test system containing the robot, a first device among the devices that has not been tested. The device shuttle is configured to move in a first dimension. The robot is configured to move the first device from the device shuttle to the test carrier. The robot is configured to move in a second dimension that is different from the first dimension.

Automated test system having orthogonal robots

An example test system includes: a test rack including test slots; first and second shuttles that are configured to move contemporaneously to transport devices towards and away from trays, with at least some of the devices having been tested and at least some of the devices to be tested; first and second robots that are configured to move contemporaneously to move the devices that have been tested from test sockets in test carriers to the first and second shuttles, and to move the devices to be tested from the first and second shuttles to the test sockets in test carriers; and first and second test arms that are configured to move contemporaneously to move the test carriers between the first and second robots and the test rack.

Automated test system having multiple stages

A method of controlling a temperature of a subject test slot in a cluster of test slots includes evaluating a request for a temperature change for the subject test slot to determine if sufficient power is available to achieve the requested temperature change, and inhibiting the requested temperature change unless or until sufficient power is determined to be available to achieve the requested temperature change.

Dependent temperature control within disk drive testing systems

A method of controlling a temperature of a test slot in a disk drive testing system includes regulating temperature changes of a subject test slot based on one or more operating conditions of one or more other test slots neighboring the subject test slot.

To measure various frequency components of the jitter of the deviation of the transition times in a signal on a signal line (44) from nominal bit times, a sampler (40) samples the signal at a rate high enough to determine the transition time with the required resolution. By employing a differentiator (60), test circuitry (FIG. 3B) can detect not only zero crossings but all digital-level transitions. The timings of the maxima of the differentiator output are applied to a Fourier-transform unit (76) that computes jitter-frequency components from a resultant sequence of deviations of the maxima from nominal transition times. Although computation of the lowest jitter-frequency components is necessarily based on a sequence that extends over a correspondingly long signal record, the input of a memory (48) that receives the raw samples from which those transition-time deviations are computed is so gated that the memory (48) receives only infrequently occurring bursts of the sampler's high-sample-rate output when the lower jitter frequencies are to be measured. A memory (48) of only moderate size can therefore be employed despite the necessarily high sample rate and necessarily long record duration.

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Sterling, MA, United States of America

Marc LeSueur Smith