Teradyne, Inc.

Marc Hutner

Ronald A Sartschev

Marc Spehlmann

John J Keough

Edward J Seng

John F Rowe

Example automatic test equipment (ATE) includes: a per-pin measurement unit (PPMU); logic configured to execute a state machine to control the PPMU; memory that is part of, or separate from, the logic; and a control system to command the logic; where, in response to a command from the control system, the state machine is configured to obtain, at a known interval or ATE event, data that is based on an output of a measurement by the PPMU and to store the data in the memory, or to output data to the PPMU from the memory at a known interval or synchronous to an event.

Controlling a per-pin measurement unit

A test system that enables real-time interactive debugging of a device under test (DUT) using native customer code. A translation module may format, in real time, debug commands, corresponding to a user input, into a format recognizable by instruments in a tester. The user input may be a test program or test instructions written in a high-level programming language. The translation module may translate the user's debug commands into lower-level test instrument commands, based on which the tester may apply control signals to a processor in the DUT to test subsystems of the DUT. A result of the test may be provided to the translation module, which may, in real time, format another debug command, or provide an indication of the result to the user. The translation module may thus enable a user to step-through and modify native customer code in an interactive manner to debug a DUT.

Debugging in a semiconductor device test environment

A test technique that may be implemented in an automated test system for testing semiconductor devices. The test technique may enable the fast detection of a signal transition, such as an edge, within a waveform and the timing of that event. Circuitry within a digital instrument that can be quickly and flexibly programmed may, at least in part, implement the test technique. That circuitry may be simply programmed with testing parameters, such that application of the technique may lead to faster test development and faster times. In operation, that circuitry receives parameters specifying parameters of a window over a waveform in which samples of the waveform will be taken to detect the signal transition. The circuitry may convert these parameters into control signals for other components in the test system, such as an edge generator or pin electronics, to take a programmed number of samples at desired times.

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Toronto, Canada

Marc Hutner