Leica Microsystems (schweiz) Ag

Leica Instruments (singapore) Pte. Ltd.

Leica Microsystems Ag

Leica Instruments Pte. Ltd.

Marc Honegger

Harald Schnitzler

Robert Paulus

Reto Zuest

A digital microscope system includes a plurality of camera systems for imaging a target region of an object, each camera system having a digital camera and an optical imaging system being aligned along an optical axis of the camera system, wherein the optical axes of the camera systems are parallel to each other; a microscope stage, on which the object is to be arranged; a positioning device; and a controller configured to control the positioning device to move the plurality of camera systems and the microscope stage relative to each other orthogonally to the optical axes of the camera systems for selectively aligning any one of the camera systems with the target region of the object.

Digital microscope system, method for operating the same and computer program

A digital microscope system comprises an imaging device configured to generate digital image data representing a target region of an object, the target region being determined by a changeable setting of the imaging device; and a controller configured to generate monitor image data corresponding to the digital image data generated in accordance with the setting, the monitor image data being configured to be displayed as a monitor image; wherein the controller is further configured to change the setting in response to a user input; and wherein the controller is further configured to compensate for a delay in updating the monitor image data in accordance with the changed setting by storing the digital image data generated in accordance with the unchanged setting in response to the user input and generating simulation monitor image data by performing digital image processing on the stored digital image data taking into account the changed setting, the simulation monitor image data being configured to be displayed as a simulation monitor image during the delay.

A microscope () is described, comprising an autofocus system () for executing a focusing procedure, having a first image sensor (), arranged in a first outcoupled beam path (), for acquiring a first image (); and a second image sensor (), arranged in a second outcoupled beam path (), for acquiring a second image (). The autofocus system () is embodied in such a way that the focusing procedure is executable on the basis of at least a first operating mode and a second operating mode.

Microscope

A microscope () is described, having an autofocus system () for executing a focusing procedure, having a first image sensor (), arranged in a first outcoupled beam path (), for acquiring a first image (); and a second image sensor (), arranged in a second outcoupled beam path (), for acquiring a second image (). The autofocus system () is embodied to adjust a relative location of the focal plane () with respect to the object plane (), at a focus displacement speed, during the image acquisition time for acquisition of the first image () acquired by the first image sensor () and of the second image () acquired by the second image sensor (), the focus displacement speed being equal to the ratio of an increment to the image acquisition time, and the increment being larger than the depth of focus of the microscope ().

A microscope () is described, having an autofocus system () for executing a focusing procedure, having a first image sensor (), arranged in a first outcoupled beam path (), for acquiring a first image (); and a second image sensor (), arranged in a second outcoupled beam path (), for acquiring a second image (). The autofocus system () is embodied to ascertain a contrast difference based on contrast values of the first image () acquired by the first image sensor () and of the second image () acquired by the second image sensor (), and to set a relative location of the focal plane () with respect to the object plane () based on the ascertained contrast difference, the first and the second image () each encompassing image information furnished by the first and the second image sensor () each embodied as an area sensor.

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Romanshorn, Switzerland

Marc Honegger