Centre National De La Recherche Scientifique

Institut National De La Sante Et De La Recherche Medicale

Sorbonne Université

Université De Paris

Other

Commissariat &#xc0; L'&#xc9;nergie Atomique Et Aux &#xc9;nergies Alternatives

Ecole Polytechnique

Université Paris Descartes

Universite Paris Cité

Université René Descartes (paris V)

Marc Guillon

Gilles Tessier

Pascal Berto

Valentina Emiliani

Eirini Papagiakoumou

Marcel Lauterbach

Dimitris Papadopoulos

Valentina Emiliant

Tengfei Wu

A method for determining wavefront shapes of a multi-spectral signal light beam from a single signal image acquisition of said multi-spectral signal beam, with a device including an optical assembly made at least of an optical mask and an imaging sensor, notably a matrix imaging sensor, for generating and recording intensity patterns of incident beams, by having these beams reflect on, or propagate through, the optical mask. The optical mask having the optical properties: i) to cause the intensity pattern to depend on the wavefront shape, so that a tilt applied to the wavefront shape results in a displacement amount of the intensity pattern, and ii) to produce uncorrelated intensity patterns over at least one surface area A of the imaging sensor, for a plurality of respective incident monochrome beams of different wavelengths having a same wavefront shape.

Wavefront sensors and wavefront shape determination using related imaging sensors

A method for determining wavefront shapes of N angular channels Cof different propagation directions P, said propagation directions Pbeing determined by a mean propagation direction vector, from a single signal image acquisition I(x,y) of a multi-angular signal light beam containing said angular channels, each angular channel Ci being separated from other angular channels Cj by an angular separation &#x394;&#x3b1;defined by &#x394;&#x3b1;=arccos, where '&#xb7;' stands for the inner product betweenand.

Method for measuring several wavefronts incoming from different propagation directions

The invention concerns an optical system () comprising:

Optical system comprising a spatial light modulator

A microscope for high spatial resolution imaging a structure of interest in a sample comprising a substance having a first state with first spectral properties and a second state with second spectral properties, the microscope comprising: an objective-lens assembly, a wave front modulating optical device adapted to spatially vary an intensity of a transfer light beam, a probe detector arranged to detect an optical measurement signal from a portion of the substance in the second state and placed in an area of the transfer light beam with an intensity adapted not to transfer the substance between the first and second states said microscope comprising a phase contrast microscopy system which includes an intensity detector arranged to detect an intensity of an illuminating light beam after said illuminating light beam has passed through the sample, the objective-lens assembly and the wave front modulating optical device.

Microscope for high spatial resolution imaging a structure of interest in a sample

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Versailles, France

Marc Guillon