Eastman-kodak Company

Marc C Digby

Robert S Young, Jr

Philip Cannata

Richard D Ball

Clyde W Hinkle, Ii

Christopher P Hansen

Mark S Bishop

Jon Isom

G Gregory Mooty

David N Jones

One aspect of the invention is a method for locating an unexposed region of film. The method includes the step of illuminating film with a light source while the film has developing chemical applied thereto, the film comprising at least two edges along an x direction perpendicular to a y direction parallel to a surface of the film. The method also includes the step of identifying an unexposed region of the film as a region containing ones of a first plurality of columns of the film, the columns disposed generally in the y direction and captured using at least one sensor operable to capture light reflected from the film, and wherein a representative value for each of the ones of first plurality of columns exceeds a threshold.

Digital film processing feature location method and system

One aspect of the invention is a method for signal modulation adjustment. The method comprises illuminating a reference target and a region of film with a first light source for a first time interval. The method further comprises capturing image data from the film in response to a first amount of light reflected from the film with a first sensor for a first integration time. The method also comprises approximately simultaneously producing a first reference output in response to a first amount of light reflected from the reference target in a field of view of a reference sensor. More particularly, the method further comprises adjusting the data in response to the reference output. In a further embodiment, the method comprises adjusting an output illumination level of the first light source in response to the first reference output before a next time interval.

Pulsed illumination signal modulation control & adjustment method and system

One aspect of the present invention is a system for estimating sensor and illumination non-uniformities. The system comprises a first light source, and a first sensor operable to capture light reflected from a first side of film illuminated by the light source while the film has a developer chemical applied thereto and processing circuitry coupled to the first sensor. The processing circuitry is operable to capture a first plurality of readings from the sensor responsive to light reflected from an unexposed region of film to determine a first set of non-uniformity data and adjust image data obtained from the film in response to the first set of non-uniformity data. In a further embodiment, the processing circuitry is further operable to dim the first light source for at least a portion of the time that the sensor is being used to sense the unexposed region of the film. The processing circuitry may also capture a second plurality of readings from the sensor while the first light source is dimmed to determine a second set of non-uniformity data and adjust image data obtained from the film in response to the second set of non-uniformity data.

Method and system for estimating sensor dark current drift and sensor/illumination non-uniformities

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Austin, TX, United States of America

Marc C Digby