General Electric Company

Marc-Andre Marois

Bernard Patrick Bewlay

David Scott Diwinsky

Arpit Jain

Xiao Bian

John Karigiannis

Stephane Harel

Steeves Bouchard

Jean-Philippe Choiniere

An inspection system includes one or more imaging devices and one or more processors. The imaging devices generate a first set of images of a work piece at a first position relative to the work piece and a second set of images of the work piece at a second position relative to the work piece. At least some of the images in the first and second sets are acquired using different light settings. The processors analyze the first set of images to generate a first prediction image associated with the first position, and analyze the second set of images to generate a second prediction image associated with the second position. The first and second prediction images include respective candidate regions. The processors merge the first and second prediction images to detect at least one predicted defect in the work piece depicted in at least one of the candidate regions.

System and method for work piece inspection

Growing community of inventors

Bromont, Canada

Marc-Andre Marois