Blackberry Corporation

Research in Motion Corporation

Marc Adam Kennedy

Arkady Ivannikov

Aleksandar Papo

Michael Andrew Carney

A test apparatus features an upper RF impermeable hood and lower RF impermeable hood, wherein each of the hoods have internal dividers. When in a closed position, the hoods and dividers create two or more RF impermeable chambers. The hoods are configured to enclose or sandwich a pallet supporting two or more printed circuit boards. One of the printed circuit boards is disposed in each chamber formed by the hoods and dividers.

Test apparatus and pallet for parallel RF testing of printed circuit boards

A method and system for testing and calibrating an accelerometer of an electronic device are provided. In accordance with one embodiment, there is a test system for an electronic device having an accelerometer with three mutually orthogonal sensing axes, the test system comprising: a test fixture having: a nest defining a cavity for receiving an electronic device; wherein the nest is configured so that, when the test fixture is substantially horizontal, a two-dimensional sensing plane defined by two of the sensing axes of the accelerometer is substantially horizontal and the third sensing axis is perpendicular to the two-dimensional sensing plane and substantially parallel to the force of gravity.

Method and system for testing and calibrating an accelerometer of an electronic device

Apparatus and methods of manufacturing an image sensor and inertial navigation sensors encapsulated within a single package. The single package may encapsulate one integrated circuit die comprising the imaging sensor and the inertial navigation sensors. Alternatively, the single package may encapsulate a plurality of integrated circuit dice comprising the imaging sensor and the inertial navigation sensors.

Single package imaging and inertial navigation sensors, and methods of manufacturing the same

A method and system for testing and calibrating an accelerometer of an electronic device are provided. In accordance with one embodiment, there is a method of testing and calibrating an accelerometer of an electronic device, comprising: detecting the electronic device within a nest of a test fixture; calculating an offset value for each sensing axis of the accelerometer in response to detecting the electronic device within the nest; and storing the offset values in a memory of the electronic device.

Growing community of inventors

Kitchener, Canada

Marc Adam Kennedy