Industrial Technology Research Institute

Mao-Sheng Huang

Wen-Jen Tseng

Wen-Lie Liang

Wen-Tron Shay

Jen-Ming Ferng

Chien-Wen Chen

Jin-Long Peng

Chia-Liang Yeh

Fu-Cheng Yang

Wei-Hsiung Tsai

Yeou-Sung Lin

Keng-Li Lin

Antony Yao

A measuring apparatus for measuring surface topography of the slides to be measured of a guide rail is provided. The measuring apparatus includes a plurality of detecting probe and at least one moving device. The detecting probes are mounted on a probe support according to the surface topography of the slides to be measured. The moving device shifts the probe support or the slides to be measured on the cross section of the guide rail so that the detecting probe has a displacement relative to the slides to be measured. Each of the detecting probes has a corresponding coordinate system, and the corresponding coordinate system is different from each other. A standard part is utilized to correct deviations among the corresponding coordinate systems to the same coordinate system, and then the same coordinate system as a benchmark to measure the surface topography of the slides to be measured.

Measuring apparatus

A device and method for detecting crystal quality of a low temperature poly-silicon (LTPS) backplane are provided, the method including: projecting narrowband light to the LTPS backplane; performing image capturing of each position on a surface of the LTPS backplane at a first angle in a first axial direction to obtain a first diffraction image, the first angle being an angle of maximum diffraction light intensity in the first axial direction; performing another image capturing of each position on the surface of the LTPS backplane at a second angle in a second axial direction to obtain a second diffraction image, the second angle being an angle of maximum diffraction light intensity in the second axial direction; and determining the crystal quality of the LTPS backplane based on a diffraction light intensity distribution obtained from the first and second diffraction images.

Quality detecting device and method

An electromagnetic field sensing apparatus includes an optical modulator, a miniature antenna for sensing the electromagnetic field, a light source, a first optical fiber, an optical detector and a second fiber. The optical modulator can vary the amplitude of a light beam propagating therethrough in response to an electric field intensity. The miniature antenna for sensing the electromagnetic field can sense both the electric field intensity and the magnetic field intensity of an electromagnetic field and apply an electric voltage to the optical modulator in response to the sensed electromagnetic field intensity. The light source is used to generate a light beam, the first optical fiber is used for transmitting the light beam to the modulator, and the second fiber is used for transmitting the light beam from the modulator to the optical detector.

Electromagnetic field sensing apparatus

Miniature antenna and electromagnetic field sensing apparatus

The present invention discloses a novel apparatus and method for stabilizing the frequency of a laser. To avoid the effect that a single-frequency absorption spectrum is easy to be affected by variations of laser power and the complexity to modulate a laser frequency, the present invention adopts at least two laser beams at different frequencies and obtains an error signal that is a difference in absorption spectrums of the laser beams. Since the error signal is a difference between two laser beams coming from an identical laser source, the variation of laser power could be eliminated. Furthermore, since the absorption spectrum is usually above hundreds of (MHz), the range of locked frequency of the present invention is large, and the laser frequency is not easily unlocked due to outside disturbance.

Apparatus and method for stabilizing the frequency of a laser

Growing community of inventors

Taichung, Taiwan

Mao-Sheng Huang