Omron Corporation

Mao Ogimoto

Hiroshi Imai

Keiki Matsuura

Hiroyuki Tokusaki

Kohei Tomita

Goro Kawakami

Atsuhiro Okamura

There is provided a non-contact voltage measurement device which can precisely measure a measurement target voltage by suppressing a flow of a leakage current via a parasitic capacitance produced between an electric field shield and an electric circuit. A drive voltage applying unit applies a voltage generated from an output voltage of a low impedance unit of the electric circuit and equal to an input voltage of a high impedance unit, to a first electric field shield coated on the high impedance unit.

Non-contact voltage measurement device

Provided is a non-contact voltage measuring device capable of measuring, with given accuracy, measurement target voltages applied to various conducting wires having respective different shapes. An inner electrode which is deformable depending on a shape of a wire 'w' is electrically connected, via a connecting section, to an outer electrode fixed to an electric field shield.

There is provided a non-contact voltage measuring sensor () in which a detection probe () is configured with a leaf spring and in which, when an external force is applied, the detection probe () deforms winding in a direction in which a tension of the leaf spring acts.

Growing community of inventors

Hirakata, Japan

Mao Ogimoto