Koninklijke Philips Corporation N.v.

Manuel Peter Viermetz

Thomas Koehler

Roland Proksa

Franz Josef Pfeiffer

The present invention relates to a system () for X-ray dark-field, phase contrast and attenuation image acquisition. The system comprises an X-ray source (), an interferometer arrangement (), an X-ray detector (), a control unit (), and an output unit (). An axis is defined extending from a centre of the X-ray source to a centre of the X-ray detector. An examination region is located between the X-ray source and the X-ray detector. The axis extends through the examination region, and the examination region is configured to enable location of an object to be examined. The interferometer arrangement is located between the X-ray source and the X-ray detector. The interferometer arrangement comprises a first grating () and a second grating (). For a first mode of operation: The control unit is configured to control at least one lateral movement transducer () to move the first grating or move the second grating in a lateral position direction perpendicular to the axis. The control unit is configured to control the X-ray detector to acquire image data whilst the first grating and/or second grating is moving. During an exposure time of the X-ray detector the first grating and/or second grating has moved a distance less than a period of the first grating and/or second grating. The control unit is configured to control movement of the first grating and/or second grating such that the image data is acquired whilst the first grating and/or second grating is moving. For the first mode of operation the output unit is configured to output one or more of: dark-field image data, phase contrast image data, and attenuation image data.

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Munich, Germany

Manuel Peter Viermetz