Sutor Bvba

Manuel Dierick

Luc Van Hoorebeke

Walter Schoenmaekers

Veerle Cnudde

Jelle Vlassenbroek

Bert Masschaele

The present invention relates to a characterization system () for characterizing an object () comprising a basic material and additional structural features. The system () comprises at least one irradiation source () for generating an irradiation beam for irradiating the object () to be characterized and at least one detector () for detecting said irradiation beam transmitted through the object (). The system () furthermore comprises a control means () for obtaining at least two different basic datasets of the object () for different configurations of the irradiation beam, the object () and the detector (). The latter may be obtained by shifting and/or rotating components and/or by selecting different components used for acquisition of the datasets. The system furthermore comprises an image processing means () for combining said at least two different basic datasets as to obtain a differential image indicating the additional structural features of the object () but substantially filtering out the basic material. The invention also relates to a corresponding method for characterizing objects and to an image processing means for processing acquired images accordingly.

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Nazareth, Belgium

Manuel Dierick