Growing community of inventors

Portland, OR, United States of America

Manu Rehani

Average Co-Inventor Count = 2.26

ph-index = 3

The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.

Forward Citations = 106

Manu RehaniWarren L Wolf (6 patents)Manu RehaniDavid A Abercrombie (4 patents)Manu RehaniKevin Cota (4 patents)Manu RehaniRobert Madge (2 patents)Manu RehaniRamon Gonzales (2 patents)Manu RehaniBruce Joseph Whitefield (1 patent)Manu RehaniJohn A Knoch (1 patent)Manu RehaniRamkumar Vaidyanathan (1 patent)Manu RehaniManu Rehani (13 patents)Warren L WolfWarren L Wolf (6 patents)David A AbercrombieDavid A Abercrombie (14 patents)Kevin CotaKevin Cota (8 patents)Robert MadgeRobert Madge (15 patents)Ramon GonzalesRamon Gonzales (2 patents)Bruce Joseph WhitefieldBruce Joseph Whitefield (32 patents)John A KnochJohn A Knoch (3 patents)Ramkumar VaidyanathanRamkumar Vaidyanathan (1 patent)
..
Inventor’s number of patents
..
Strength of working relationships

Company Filing History:

1. Dw Associates, LLC (5 from 5 patents)

2. Lsi Logic Corporation (4 from 3,715 patents)

3. Lsi Corporation (2 from 2,353 patents)

4. Other (1 from 832,843 patents)

5. Netapp, Inc. (1 from 2,767 patents)


13 patents:

1. 9787454 - Storage system for pervasive and mobile content

2. 9667513 - Real-time autonomous organization

3. 9269353 - Methods and systems for measuring semantics in communications

4. 9020807 - Format for displaying text analytics results

5. 8996359 - Taxonomy and application of language analysis and processing

6. 8952796 - Enactive perception device

7. 8577718 - Methods and systems for identifying, quantifying, analyzing, and optimizing the level of engagement of components within a defined ecosystem or context

8. 7390680 - Method to selectively identify reliability risk die based on characteristics of local regions on the wafer

9. 7305634 - Method to selectively identify at risk die based on location within the reticle

10. 6880140 - Method to selectively identify reliability risk die based on characteristics of local regions on the wafer

11. 6807655 - Adaptive off tester screening method based on intrinsic die parametric measurements

12. 6658361 - Heaviest only fail potential

13. 6512985 - Process control system

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as of
12/30/2025
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