Koninklijke Philips Corporation N.v.

Manoj Chandran

Swaroop Adusumilli

The present invention is a system and method that facilitates flexible restriction of output transmissions from chosen scan test cells and reduces adverse impacts on functional components from coincidental test vector values during scan test operations. The system and method of the present invention provides the capability of masking test vector values that coincidentally trigger certain undesirable events in functional components. In one embodiment, a system and method of the present invention masks test vector values shifted into scan test cells that are coupled to bus driver enabling signals. The system and method of the of the present invention also facilitates flexible selection of which scan test cell outputs are masked and permits a scan test cell to provide a scan test vector value to an associated functional component and prevent coincidental transmission of inappropriate test vector values.

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Tempe, AZ, United States of America

Manoj Chandran