Honeywell International Inc.

Manish Patodi

Devesh Bhatt

Kirk A Schloegel

David V Oglesby

Steve Hickman

Systems and methods for type and range propagation through data flow models are provided. In one embodiment, a test generating system for processing data flow diagrams, the system comprises: a processor programmed to perform a test generation process; and at least one memory device coupled to the processor, the at least one memory device including a data flow diagram. The test generation process computes range information and data type information for outputs of one or more functional blocks defined by the data flow diagram by applying transformations to input range information for inputs of each of the one or more functional blocks. The transformations are at least in part performed by applying specific mathematical and functional effects that are pre-defined for each of the one or more functional blocks based on block type.

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Morristown, NJ, United States of America

Manish Patodi