Case Western Reserve University

Carl Zeiss Gmbh

Manish D Kulkarni

Joseph A Izatt

Ming Lai

Jay Wei

Michael V Sivak

Kabir Arianta

A method is described for determining depth-resolved backscatter characteristics of scatterers within a sample, comprising the steps of: acquiring a plurality of sets of cross-correlation interferogram data using an interferometer having a sample arm with the sample in the sample arm, wherein the sample includes a distribution of scatterers therein, and wherein the acquiring step includes the step of altering the distribution of scatterers within the sample with respect to the sample arm for substantially each acquisition; and averaging, in the Fourier domain, the cross-correlation interferogram data, thereby revealing backscattering characteristics of the scatterers within the sample.

Depth-resolved spectroscopic optical coherence tomography

One embodiment of the present invention is an optical path length scanner which includes: (a) a set of prisms mounted evenly along a movable carrier; and (b) a mechanism that drives the movable carrier to move.

Optical path length scanner using moving prisms

Growing community of inventors

San Ramon, CA, United States of America

Manish D Kulkarni