Hoechst Aktiengesellschaft

Manfred Ruckszio

Raimund Haas

Hugo Schmidt

Walter Mackert

With an infrared radiator, the surface temperature of which is kept constant during measurement, a measuring area on a material surface is thermally irradiated with oblique incidence of the rays. The temperature of the reflected thermal radiation is measured by an infrared thermometer, which is arranged above the measuring area in such a way that the reflected radiation falls into the area of coverage of the infrared thermometer. The entire measuring area of the material surface which lies in the field of coverage of the infrared thermometer must be thermally irradiated. The measured temperature variation of the reflected radiation in dependence on the surface condition of the material is stored in a comparison device. A set value for the desired surface condition is fed to this comparison device. The infrared temperature of a material surface, initially unknown with respect to its surface condition, is measured and compared with the stored temperature variation in order to determine the magnitude of the surface parameter. From the value thus obtained and the set value fed in, a differential signal is formed, which is fed via the output of the comparison device to a control of a treatment device for the material.

Method of and measuring arrangement for contactless on-line measurement

With an infrared radiator, the surface temperature of which is kept constant during measurement, a measuring area on a roughened material surface is thermally irradiated with oblique incidence of the rays. The temperature of the reflected thermal radiation is measured by an infrared thermometer, which is arranged above the measuring area in such a way that the reflected radiation falls into the area of coverage of the infrared thermometer. The entire measuring area of the material surface which lies in the field of coverage of the infrared thermometer must be thermally irradiated. The measured temperature variation of the reflected radiation in dependence on the known surface roughness of the material is stored in a comparison device. This comparison device is fed a set value for the desired surface roughness. The infrared temperature of a material surface, initially unknown with respect to its surface roughness, is measured and compared with the stored temperature variation, in order to determine the magnitude of the surface roughness. From the value thus obtained and the set value fed in, a differential signal is formed, which is fed via the output of the comparison device to a control of a treatment device for the material.

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Taunusstein, Germany

Manfred Ruckszio