Atg Test Systems Gmbh & Co. Kg

Atg Test Systems Gmbh

Atg Electronic Gmbh

Manfred Prokopp

Rudi Geier

Bernd Ott

Roland R Stoehr

Josef Mozzi

Volker Goldschmitt

Konstantin Arnaudov

A probe for a circuit board tester as well as to an adapter and a circuit board tester. The probe comprises a needle and a sleeve, the needle being shiftingly guided in the sleeve and the needle protruding at least 10 mm from the sleeve, more particularly more than 20 mm. In one embodiment, the needle is conically tapered to a contact tip at least in a portion protruding from the sleeve. With the probe in accordance with the invention, adapters for circuit boards can be produced comprising contacts in high-density, the probes simultaneously acting resiliently.

Circuit board tester probe system

A circuit board tester includes a contact array, contact fingers arranged for travelling in a plane parallel to the contact array, two contact fingers forming a probe pair as a component of a test current circuit, a controller for positioning the contact fingers on circuit board test points of a circuit board to be tested, the circuit boards being insertable into the tester simultaneously during a test procedure being tested, and two sets of contact fingers, one set being arranged for testing the front side and the other set for testing the rear side of a circuit board to be tested. Arranged between the two sets of contact fingers is a holder comprising portions for accommodating at least two circuit b to be tested, at least one of the circuit boards to be tested being insertable in the holder with its front side, and the other circuit board to be tested with its rear side, facing one of the two sets of contact fingers, and the controller is configured such that with both sets of contact fingers the circuit board test points on both the front and rear side of the circuit board to be tested can be contacted during a test procedure.

Testing device for printed circuit boards

The test needle has, for contacting a circuit board test point, a contact portion configured conically tapered to a free contact tip. The contact portion has a length of at least 15 mm and at the contact tip a diameter smaller than 0.2 mm. An end section of the contact portion apposite the contact tip comprises a diameter at least 0.1 mm larger than the contact tip. With the test needle in accordance with the invention, extremely dense structures on circuit boards can be strobed. The test needle in accordance with the invention is stiffer than known test needles for strobing comparable structures. This simplifies their handling and the configuration of a pattern adapter incorporating these test needles.

Test needle for pattern adapter of circuit board tester

Device for testing printed boards

The invention relates to a finger tester probe including a probe element for electrically contacting a contact point of a circuit board under test, an actuator including a permanently premagnetized core and a solenoid element. The solenoid element is shiftingly arranged on the permanently premagnetized core and is mechanically connected to the probe element. Upon being energized, the solenoid element is moved together with the probe element. Since in accordance with the invention a movable part of the actuator is not mechanically connected to a fixed part of the actuator, the test probe which is attached to the movable part is able to bring the probe element into contact with a contact point of a circuit board under test at high speed.

Finger tester probe

A circuit board test apparatus comprises a plurality of circuit board test points. The test apparatus is provided with an electronic analyzer comprising a plurality of test connections, each circuit board test point being in contact with a test connection via an electrical connection. The electronic analyzer is electrically connected to a grid pattern, an adapter and/or a translator being mounted on the grid pattern. The adapter and/or translator, on which a circuit board to be tested is to be placed, produces an electrical contact from circuit board test points on the circuit board to contact points of the grid pattern. At least two contact points of the grid pattern are electrically connected to each other.

Printed circuit board test apparatus and method

A circuit board test apparatus comprising a plurality of circuit board test points is provided with an electronic analyzer comprising a plurality of test connections, each circuit board test point of the board under test being in contact with a test connection via an electrical connection. At least two of the electrical connections are electrically connected so that at least two circuit board test points of the board under test are in connection with a sole test connection.

Apparatus and method for testing non-componented printed circuit boards

An electric circuit board tester comprises a contact board (1) configured as a circuit board and contact elements on a testing side, for example its upper side, which can be connected to test points on the circuit board to be tested. The other side of the contact board has contact points (4) electrically connected to the contact elements via conductors (3). Electronic units (8) are releasably secured to the side of the contact board (1) comprising the contact points, such that a physical connection to the contact board (1) and an electrical connection between the electronic units (8) and the contact points (4) are simultaneously achieved.

Electric circuit board tester

An automated circuit board tester comprises an unstacker (1) arranged upstream of a testing device and which by means of a circuit board picker (40) arranged above a chute (30) picks a top-most circuit board from a stack of circuit boards (55) located in the chute (30). The chute (30) comprises a lifting device including at least two sets of vertically travelling supporting elements (38, 101), each of which is able to carry a stack of circuit boards (55). The chute (30) is open at least on one side so that a set of supporting elements (38, 101) can be loaded while a stack of circuit boards (55) located on the other set of supporting elements (38, 101) is unstacked by the circuit board picker (40).

Automated circuit board tester

Testing device for testing electrical or electronic test specimens

A multispindle machine for drilling, milling or the like of workpieces has several spindles mounted on at least one crossbeam rail (4), and the workpieces and spindles can be displaced relative to one another along X and/or Y coordinates. To minimize machining time, each crossbeam rail mounts at least two spindles (3) which are displaceably independently of one another in the long direction or X coordinate of the crossbeam rail (4).

Growing community of inventors

Wertheim-Reicholzheim, Germany

Manfred Prokopp