Matsushita Electric Industrial Co., Ltd.

Tower Semiconductor Ltd.

Manabu Komiya

Yasuhiro Tomita

Hitoshi Suwa

Toshiki Mori

Noam Eshel

Tetsuyuki Fukushima

Akifumi Kawahara

Masakazu Kurata

Masatoshi Shinagawa

Jeffrey Allan Jacob

Tamas Toth

Avi Parvin

A semiconductor leakage current detector of the present invention includes a first analog switch which causes a current to be measured to flow or to be cut off, a second analog switch which causes a reference current to flow or to be cut off, an integral capacitance element which is connected by the first analog switch and the second analog switch and is charged with the current to be measured or the reference current, a discharge unit which discharges the integral capacitor, and a comparison unit which compares the reference voltage with each of an integral voltage generated in the integral capacitor by a reference current after the discharge of the integral capacitor and an integral voltage generated in the integral capacitance element by the current to be measured after the discharge of the integral capacitor.

Semiconductor leakage current detector and leakage current measurement method, semiconductor leakage current detector with voltage trimming function and reference voltage trimming method, and semiconductor integrated circuit thereof

In conventional memory arrays in which a bit line is shared by memory cells, a cell current flows over into neighbor cell(s) in a program verify process, and therefore, the threshold of a memory cell to be programmed is erroneously determined to be lower. Therefore, in a program verify process, a control circuitwrites a fail value to a neighbor cell bufferwhen all neighbor cell(s) having an offset of n or less from a memory cell to be programmed are in the erased state, and when otherwise, writes a pass value to the neighbor cell buffer. The control circuitverifies input write data and also verifies data stored in the neighbor cell buffer(s). In the latter verify process, a verify voltage higher than an ordinary one is used to compensate for the leakage of cell current.

Flash memory and program verify method for flash memory

The non-volatile semiconductor storage deviceincludes the specific command Enable/Disable signal linesconnected to the command decoder. The specific command Enable/Disable signals are externally inputted to the command decoderthrough the signal lines. Thereby, when the deviceis initialized, the command decoderenables the specific command and the devicecan shift to a mode corresponding to the specific command. On the other hand, the command decoder 108 can disable the specific command, for example, when a user uses the device, thereby preventing the specific command from being executed even when the specific command is erroneously issued.

Non-volatile semiconductor storage device with specific command enable/disable control signal

An n-bit status signal indicating an execution state of a write command is outputted from a status register. At the time of data writing, an output switching circuit outputs (n&#xd7;m)-bit data in which a status signal pattern repeats m times. At the time of data reading, the output switching circuit outputs data stored in a memory cell array.

Nonvolatile semiconductor memory device for outputting a status signal having an output data width wider than an input data width

To provide a nonvolatile memory microcomputer with which a step of testing a microcomputer unit using a logic tester can be omitted, thereby reducing the testing cost. A memory tester supplies test data and expectation data to the nonvolatile memory microcomputer, and the nonvolatile memory microcomputer stores them in a nonvolatile memory. Subsequently, upon receiving an address signal, the nonvolatile memory outputs a test signal and an expectation signal based on test data and expectation data corresponding to the address signal. The test signal is supplied to a circuit block in the microcomputer unit, to drive the circuit block. The circuit block returns a test result signal, which is output to the memory tester together with the expectation signal. The memory tester compares the test result signal and the expectation signal, to judge whether the microcomputer unit operates correctly.

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Kyoto, Japan

Manabu Komiya