Renesas Electronics Corporation

Nec Electronics Corporation

Manabu Kitabatake

Yuji Tada

Hironori Nakamura

Takayuki Kurokawa

Tsuyoshi Hirakawa

Kazunori Yamane

Ichiro Mizuguchi

Kouji Naganawa

A semiconductor integrated circuit device includes a first chip including an internal circuit, and a second chip capable of being accessed only via the first chip, and a test processor circuit electrically connected internally via the first chip, for accessing the second chip from an external terminal and testing the second chip, and a test circuit where an input/output buffer is installed for signals for accessing the second chip within the test processor circuit, and a bypass line installed for transferring signals from the first chip to the second chip and avoiding the input/output buffer within the test processor circuit, and a switch which switches between signal transfer path via the input/output buffer, and a signal transfer path via the bypass line.

Semiconductor integrated circuit device which has first chip and second chip accessed via the first chip and test method thereof

A semiconductor integrated circuit device includes a first chip, a second chip to transmit and receive data to and from the first chip, and a through circuit provided in the first chip to transfer a clock signal and a test signal to the second chip. The clock signal and the test signal is inputted from an external device. The through circuit adjusts timing relation between the clock signal and the test signal based on a timing adjust signal. The timing adjust signal is inputted from the external device.

Power supply voltage detection circuit and semiconductor integrated circuit device

Growing community of inventors

Kanagawa, Japan

Manabu Kitabatake