Yokogawa Electric Corporation

Agilent Technologies, Inc.

Mamoru Tamba

Nobuaki Ema

Takaaki Matsuda

Ikutomo Watanabe

Kazunori Tanimura

Shunsuke Hayashi

Takeshi Arimizu

An I/O module includes a base plate, a plurality of universal circuits, and an option module. The base plate includes a plurality of connection terminals. A plurality of field devices is electrically connectable to the connection terminals. The universal circuits correspond to the connection terminals. The universal circuits are provided on the base plate, and configured to perform an input of analog signals from the field device, an output of analog signals to the field device, an input of discrete signals from the field device, and an output of discrete signals to the field device. The option module is detachably provided in the base plate. The option module is provided between a first connection terminal of the connection terminals and a first universal circuit of the universal circuits. The option module includes a first circuit configured to performing transmitting and receiving of signals between the first connection terminal and the first universal circuit. The first connection terminal corresponds to the first universal circuit.

I/O module

An input/output (I/O) module is configured to connect a controller and a field device. The I/O module includes a PWM (pulse width modulation) demodulator configured to demodulate a PWM signal that is input from the controller, a current source configured to output a current based on an output signal of the PWM demodulator to the field device, a resistance connected in line with the current source, and a feedback circuit configured to feed back an output current of the current source to the PWM demodulator via the controller.

In order to provide a signal measuring apparatus which satisfies multiple performances at a high level all together, the signal measuring apparatus includes: DC performance; noise performance; distortion performance; spurious performance; and the like, a signal measuring apparatus includes: multiple A/D converters which respectively have different conversion characteristics for converting from an analog signal outputted from a DUT to digital signals; digital circuits which are provided in correspondence with the A/D converters and which conduct predetermined operations based on the conversion characteristics of the A/D converters.

Signal measuring apparatus and semiconductor testing apparatus

An object of the invention is to implement an IC tester wherein an analog test module can be provided at a test head while maintaining flexibility of the test head. The IC tester comprises an analog test module for testing an analog signal against the device under test. The analog test module comprises a main substrate, connected to the device under test, a first sub-substrate connected to the main substrate, the first sub-substrate comprising first analog circuits and first digital circuits electrically connected to the first analog circuits, wherein an analog test is conducted by the first analog circuits, and the first digital circuits, and a second sub-substrate connected to the main substrate, the second sub-substrate comprising second analog circuits and second digital circuits electrically connected to the second analog circuits, wherein an analog test is conducted by the second analog circuits, and the second digital circuits.

IC tester

A single end to differential signal converter comprising a low-frequency transmission step, which mixes the direct current and low-frequency components of single-ended signals with in-phase voltage signals to generate low-frequency signals, and a high-frequency transmission step, which mixes the high-frequency component of these single-ended signals and these low-frequency transmission signals to generate differential signals.

Single end to differential signal converter

A method and low cost apparatus to accurately determine the gain, offset, and/or skew calibration values of each A/D converter in a few steps for an interleaving A/D converter. The calibration method includes: applying sine waves to the input as a calibration signal during calibration, A/D converting of the sine wave by a plurality of A/D conversion means in a predetermined order and storing the converted data in a data storage memory, and determining the gain, offset, and/or skew calibration values by using sine curve fitting on a sequence of converted data for each of the plurality of A/D conversion means.

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Tokyo, Japan

Mamoru Tamba