Hitachi, Ltd.

Nippon Telegraph and Telephone Corporation

Mamoru Katane

Manabu Matsumoto

Toshiaki Kobari

Hiroshi Akiyama

Koji Matsuda

Masahiro Tadokoro

Shunji Kakiuchi

Hiroaki Sakurabata

Nobuo Hirano

Shiro Matsuzaki

Takashi Ikeguchi

Tadasi Sonobe

Shinjiro Ueda

Takao Takahashi

Toa Hayasaka

Toyoki Kitayama

A particle therapy system capable of measuring energy of a charged particle beam even during irradiation of the charged particle beam is provided. A beam delivery (irradiation) system comprises a block collimator constituted by a pair of collimator members, and an energy detector mounted to one of the collimator members to be disposed on the upstream side thereof. When the pair of collimator members are moved in directions away from each other, a beam passage is formed between them. The energy detector constitutes an energy measuring device together with a signal processing unit. A part of the ion beam having reached the interior of the irradiation nozzle is irradiated to a patient through the beam passage. When a part of the remaining ion beam enters the energy detector, electric charges generate in the energy detector. The signal processing unit determines energy of the ion beam based on a position within the energy detector at which electric charges have generated in maximum amount.

Particle therapy system

An apparatus for treating the inner surface of a vacuum chamber includes a support, means for anchoring the vacuum chamber to the support and holding the vacuum chamber, a broach having a plurality of cutting edges having cutouts, and broach drive means to which the broach arranged on the support is fitted. The broach drive means unidirectionally moves the broach relatively to the vacuum chamber in an axial direction to cut off a contaminated layer on an inner surface of the vacuum chamber. The outer diameter of each cutting edge, excluding the cutouts, is set greater than that of an immediately preceding one in a direction of a rearmost edge face from a front edge face. The apparatus may also include means for supplying an inert gas or a mixture of nitrogen and inert gases to a surface of the vacuum chamber being treated by the broach, or means for supplying a lower alcohol for dissolving contaminants contained in the contaminated layer to the surface of the vacuum chamber being treated by the broach.

Apparatus for treating the inner surface of vacuum chamber

A rod driver is used to drive a rod so as to move a broach through a continuous vacuum chamber in the axial direction. The broach is provided at the leading end of the rod with cutting and finishing edges at a plurality of stages in the axial direction. The cutting edges each have chip breakers in their outer periphery. The broach is moved in the vacuum chamber to cut the inner surface of the vacuum chamber, so that a new surface is formed. During the cutting at least one of an inert gas, nitrogen, and a mixture of the inert gas and nitrogen is supplied to the cutting edges. The outer diameter of the finishing edge is same as the desired inner diameter of the vacuum chamber and the finishing edges are effective in forming such a vacuum chamber with greater precision and the least friction. As a contaminated and decomposed layer on the inner surface of the vacuum chamber is removed in the axial direction of the inner surface of the vacuum chamber for certain, moreover, gas desorption, from a new surface, originating from thermal desorption and photodesorption generated at the time of synchrotron radiation can be minimized to satisfy a requirement for a vacuum vessel.

Process and apparatus for treating inner surface treatment of chamber

Synchrotron radiation is generated when a base of charged particles is bent by a bending magnet. The synchrotron radiation passes down a lead-out duct as the total number of pumps is limited by the size of the apparatus and many pumps are needed in order to achieve a good vacuum. An ion pump has a main magnetic field, normally generated by a magnet of the ion pump which controls the behavior of the electrons in the ion pump. However, the leakage magnetic field of the bending magnet affects the ion pump, and therefore the ion pump is arranged so that its main magnetic field is aligned with the leakage magnetic field at the ion pump, or at least with a main component thereof. In this way, the effect of the leakage magnetic field on the ion pump is reduced. Indeed, it is possible to use the leakage magnetic field as the main magnetic field of the ion pump.

Synchrotron radiation generation apparatus

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Hitachi, Japan

Mamoru Katane