Fujitsu Corporation

Mamoru Arisumi

Ikuo Shimada

Takahiro Osada

A test method which tests a processing device includes: obtaining a maximum number of processing units with which the processing device as a test target can simultaneously parallel process a plurality of threads; specifying a number of threads, causing the processing device as the test target to parallel process the threads, and obtaining a processing time corresponding to the number of threads; and outputting information indicating that the processing device as the test target is normal when the number of threads for which the processing time is more than or equal to a threshold matches the maximum number of processing units which can simultaneously parallel process, or outputting information indicating that the processing device as the test target is abnormal when the number of threads does not match.

Test method, test apparatus, and recording medium

An information processing apparatus includes a memory, and a processor coupled to the memory. The processor is configured to collect information including a diagnosis history regarding a plurality of components of the information processing apparatus in application processing by the information processing apparatus, determine priority level settings from among a plurality of offline diagnoses with regard to each of the components, prioritize offline diagnosis of the information processing apparatus based on the information and the priority level settings, and perform the plurality of offline diagnoses with regard to the components at a time of the offline diagnosis of the information processing apparatus based on the priority level settings.

Growing community of inventors

Kawasaki, Japan

Mamoru Arisumi