Eagle Technology, LLC

Harris Corporation

University of Colorado

Malcolm O'Sullivan

Cormic K Merle

Tukaram K Hatwar

Eugene George Olczak

Steven McClellan George

Daniel Balonek

Rebecca Borrelli

Gene Olczak

James Throckmorton

Tyler Myers

Methods of producing an optical surface atop an exterior of a substrate that includes smoothing the exterior using an ALD process to sequentially deposit ALD layers to produce one or more ALD films that fill spaces between spaced-apart asperities existing on the exterior, and thereafter depositing a reflective material on the smoothed exterior of the substrate to produce the optical surface. The smoothing resulting from depositing the ALD film on the exterior of the substrate causes the grain size of the reflective material to be reduced in comparison to the grain size that would exists without having deposited the ALD film on the exterior of the substrate. The smoothing is sufficient to cause a reduction in grain size that results in a reduction in plasmon absorption in the optical surface in comparison to the plasmon absorption that would otherwise exist without having reduced the grain size of the reflective material.

Smoothing surface roughness using atomic layer deposition

A system for testing an optical surface, the system comprising a non-coherent light source, a detector, a test plate positioned between the non-coherent light source and the optical surface, the test plate separated from the optical surface by a gap, and a processor. The processer is configured to cause the non-coherent light source to illuminate the test plate and optical surface with non-coherent light, control the detector to capture an interferogram produced by interference between light reflected from the test plate and light reflected from the optical surface, and perform quantitative analysis on the interferogram to characterize aberrations in the optical surface.

QTIP&#x2014;quantitative test interferometric plate

An alignment reference module (ARM) for detecting an alignment of a hologram with respect to a spindle axis of a spindle that supports an optic device under test (DUT). The hologram is employed for testing an optical surface of the DUT. The ARM includes a flat portion having a reflective surface for reflecting light back toward the hologram member to detect tilting of the hologram relative to the spindle axis. The ARM also includes a spherical portion having a reflective surface adjacent the flat portion for transmitting light back toward the hologram member to detect a radial position of the hologram relative to the spindle axis.

System and method for optics testing using a plano holographic null incorporating alignment features

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Pittsford, NY, United States of America

Malcolm O'Sullivan