Hitachi, Ltd.

Hitachi-ge Nuclear Energy, Ltd.

Makoto Senoo

Tetsuya Matsui

Naoyuki Kono

Masahiro Koike

Akira Nishimizu

Yoshio Nonaka

Masahiro Tooma

Yosuke Takatori

Hirofumi Ouchi

Akihiro Taki

Hirokazu Adachi

Takao Shimura

Disclosed is an eddy current flaw detection probe that is capable of pressing itself against an inspection target whose curvature varies. A flaw sensor is configured by fastening a plurality of coils to a flexible substrate that faces the surface of the inspection target. A first elastic body is positioned opposite the inspection target for the flaw sensor, is obtained by stacking two or more elastic plates, and has an elastic coefficient that varies in a longitudinal direction. A second elastic body is a porous body positioned between the flexible substrate and the first elastic body. A pressure section is employed to press the first elastic body toward the inspection target.

Eddy current flaw detection probe

An ultrasonic inspection instrument for detecting a crack and performing sizing in the depth direction of the crack. By a transmitter element array and a receiver element array included in a common sensor, focus points between focused acoustic fields are electronically scanned in a range including a location where half the sum of the transmitting angle of ultrasonic waves to an inspection-target material and the receiving angle of diffraction echoes from the inspection-target material is 30 degrees, so that a tip portion of the crack is detected from the received diffraction echoes. Thus, the detectability of the ultrasonic inspection instrument for detecting diffraction waves in a subject to be inspected and performing crack inspection is stabilized and kept high.

Ultrasonic array sensor, ultrasonic inspection instrument and ultrasonic inspection method

Growing community of inventors

Tokai, Japan

Makoto Senoo