Sharp Kabushiki Kaisha Corporation

Makoto Miyago

Mikio Katayama

Masaya Okamoto

Yuji Yamamoto

Yasunobu Tagusa

Hiroaki Kato

Yuzuru Kanemori

Naofumi Kondo

Hidetaka Mizumaki

Kiyoshi Nakazawa

Akihiko Imaya

Takayoshi Nagayasu

Toshihiko Hirobe

Makoto Tachibana

Mikio Hashimoto

Yoshihiro Hattori

Hiroshi Oka

A display device includes a display panel for displaying information, and a driving circuit for driving the display panel. The driving circuit of the display device is capable of changing, with a lapse of display time, a displayed color of information which is statically displayed on the display panel.

Display device and instrument panel and automobile incorporating the same

This invention provides an inspecting method, an inspecting apparatus, and a defect correcting method, for an active matrix substrate including: a gate bus line; a source bus line; a pixel electrode; a switching element for driving the pixel electrode; and a pair of electrodes constituting an auxiliary capacitance. The inspecting method includes: a step of disposing a counter substrate having a face on which a counter electrode is formed so that the face faces the active matrix substrate with a liquid crystal layer interposed therebetween, and connecting signal supplying terminals to gate bus lines and source bus lines and the counter electrode; and a detection step of detecting a defect on the active matrix substrate by performing at least one of a first signal generating step, a second signal generating step, and a third signal generating step. The first, second, and third signal generating steps all include alternately applying an ON signal for turning on the switching element and an OFF signal for turning off the switching element to the gate bus line. The first signal generating step includes applying a first detecting signal having a voltage which changes before the ON signal is applied to the source bus line. The second signal generating step includes applying a second detecting signal having a voltage which changes before and after the ON signal is applied. The third signal generating step includes applying a third detecting signal having a voltage which changes after the ON signal is applied.

Inspecting method, inspecting apparatus, and defect correcting method

An electronic measuring apparatus is placed on a drawing or other material on which a measuring object is drawn. The apparatus has a main display of a dot matrix liquid crystal display having a touch sensor. A plurality of points corresponding to the measuring object such as a graphic are entered as specific points. A calculating section calculates lengths of a straight line and a curve, an angle between two straight lines, or regional area of a region based on coordinate data of the respective specified points. The calculated results are shown on the main display. With the arrangement, the respective measurings of the length, angle, regional area, and other measuring object are carried out with ease and high accuracy. Moreover, a variety of processings such as unit conversion and scale factor conversion can be carried out only by entering respective specific data.

Electronic measuring apparatus for measuring objects of a figure or on a

The production of a thin film transistor array device having a gate wiring on an insulated substrate. The gate wiring has an inner gate wiring having a first metal layer formed on the insulated substrate and a second metal layer whose etching speed is faster than that of the first metal layer, the first metal layer and the second metal layer being overlapped so as to constitute a dual structure, and an outer gate wiring covering the inner gate wiring.

Thin film semiconductor array device

Growing community of inventors

Higashiosaka, Japan

Makoto Miyago