Mitutoyo Corporation

Makoto Kaieda

Akira Takada

Hiroyuki Yoshida

Hidemitsu Asano

Koichi Komatsu

Gyokubu Cho

Takashi Hanamura

Takuho Maeda

Isao Tokuhara

Fumihiko Koshimizu

Eiji Furuta

Makoto Uwada

An image measuring method performed with an image measuring device measuring a dimension of a measured object from an image of the measured object captured by an image capturer. The method executes a standard reference object measurement measuring a dimension of the standard reference object with the image measuring device; a standard reference dimension input inputting a dimension of the standard reference object specified by a device other than the image measuring device; a preset value calculation calculating a preset value from the dimension of the measured standard reference object and from a dimension of the standard reference object measured by a predetermined measurement tool; a measurement measuring a dimension of a measured object other than the standard reference object using the image measuring device; and a correction correcting the dimension of the measured object other than the standard reference object measured by the image measuring device.

Image measuring method and apparatus

An image measuring apparatus including an image measurer capable of switching between one of a type of lens and a magnification power, the image measurer obtaining an image of a measured object; a display displaying the image obtained by the image measurer and providing an operation screen to a user; and a controller controlling operations of the image measurer and the display. A calibration value and an expiration date for the calibration value are recorded by the controller for one of each type of lens and each magnification power. The controller communicates to the user, using the display, that one of the lens and the magnification power has an expired calibration value.

Image measuring apparatus and user interface for management of calibration of image measuring apparatus

A distance in a scanning direction between a first set of edges which face each other and exhibit an opposite change between light and dark is measured by an image measuring machine, and a bias correction value is calculated based on a difference between a measured value and a true value. Using the bias correction value, detection point correction values, which are correction values in various directions of edge detection points detected by a scan of a measured object using the image measuring machine, are calculated; a correction amount used in correction of the edge detection points is specified based on the detection point correction value in each direction; and the edge detection points are corrected using the correction amount.

Edge detection bias correction value calculation method, edge detection bias correction method, and edge detection bias correcting program

A hardness tester includes a memory storing, as a parts program, definitions of measurement conditions including a coordinate system and test position defined with respect to an image of a standard reference sample; a pattern searcher performing a pattern searching process, with reference to a plurality of samples to be measured, using a pattern image based on the image of the standard reference sample, and detecting a number of samples having a shape identical to that of the standard reference sample, as well as a position and angle of the samples having the identical shape; a pattern definer defining a coordinate system and test position for each of the samples having the identical shape based on the position and angle of each of the samples having the identical shape; and a measurer measuring the hardness of the samples for which the coordinate system and test position have been defined.

Hardness test apparatus and hardness testing method

The present invention includes: an image capturer capturing an image of the sample to be measured; an image acquirer acquiring image data of the sample captured by the image capturer; a pattern searcher performing, on the image data of the sample acquired by the image acquirer, pattern searching process using a pattern image selected based on the sample and identifying a position in the image matching the pattern image; a profile extractor extracting a profile of the sample based on the position in the image identified by the pattern searcher; a calculator calculating a hardness measurement position of the sample based on the profile extracted by the profile extractor; and a measurer executing hardness testing on the sample based on the hardness measurement position calculated by the calculator and measuring the hardness of the sample.

Disclosed is a slit width adjusting device comprising: a pair of slit members parallel to each other, which is moved to approach each other or to be separated from each other to adjust a slit width; a driving section to move the pair of slit members; an absolute position original point detection section to detect an arbitrary absolute position of the slit members as an original point; and an adjustment section to adjust the slit width, wherein the adjustment section comprises: a storage unit to store a slit width table in which a displacement amount of the slit width from the original point, and a drive instruction value corresponding to the displacement amount, are corresponding to each other; and a drive control unit to extract the drive instruction value corresponding to a specified slit width, to drive the driving section according to the extracted drive instruction value.

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Miyazaki, Japan

Makoto Kaieda