Olympus Corporation

Makio Ueno

Hiroshi Sasaki

Tatsuo Nakata

Atsuhiro Tsuchiya

Junichi Okada

Akinori Araya

Yasunari Matsukawa

Makoto Araki

Hiroyasu Hebiishi

Shingo Suzuki

Yoshihiro Shimada

Naoki Hayashi

Yusuke Yamashita

Hirokazu Kubo

Masahito Dohi

Eiji Yokoi

Shingo Tamano

Kanako Kondo

Masahito Oohi

Takuma Kimura

A fluorescence observation apparatus includes a fluorescence observation unit, which includes a scanner that scans ultrashort pulsed laser light from a light source, a pupil projection lens that focuses the laser light scanned by the scanner, an image-forming lens that converts the focused laser light to substantially collimated light and causes the laser light to be incident on an objective lens, and a dichroic mirror that splits off fluorescence that is generated by the laser light focused on a sample by the objective lens and is collected by the objective lens. A photodetector detects the fluorescence split off by the dichroic mirror. A multi-mode optical fiber connects the fluorescence observation unit and the photodetector. A swiveling mechanism causes the fluorescence observation unit to swivel about an axis near the focal position of the objective lens. And a light-source optical fiber connects the light source and the fluorescence observation unit.

Fluorescence observation unit and fluorescence observation apparatus

A fluorescence observation unit includes a scanner that scans ultrashort pulsed laser light, a pupil projection lens that focuses the scanned ultrashort pulsed laser light, an image-forming lens that converts the focused ultrashort pulsed laser light to substantially collimated light and causes the ultrashort pulsed laser light to be incident on the objective lens, and a dichroic mirror that splits off, from the optic path of the ultrashort pulsed laser light, fluorescence generated in a sample due to irradiation with the ultrashort pulsed laser light and collected by the objective lens. The image-forming lens includes a first optical system having positive refractive power, and a second optical system having negative refractive power and disposed at a position closer to the scanner than the first optical system is. The dichroic mirror is disposed between the first optical system and the second optical system.

In order to allow precise observation of a specimen at an observation point with a desired depth without changing the working distance of an objective optical system while employing a simple configuration, a laser scanning microscope according to the present invention includes an objective lens having a plurality of optical elements that are disposed with gaps therebetween in an optical-axis direction and that condense laser light emitted from a light source onto a specimen and also having an adjustment ring that allows changing of the focal point by moving the optical elements in the optical-axis direction; a scanner that has a galvanometer mirror capable of oscillating about a predetermined oscillation axis and that scans the laser light condensed onto the specimen by the objective lens in accordance with an oscillation angle of the galvanometer mirror; a light detecting unit that obtains image information of the specimen on the basis of return light returned from the specimen scanned with the laser light; and a scanner controlling unit that controls the oscillation angle of the galvanometer mirror so as to maintain an observation range of the specimen observed by the light detecting unit on the basis of the positions of the optical elements moved by the adjustment ring.

Laser scanning microscope

A microscope system includes a laser light source, a plurality of laser microscopes, and an optical path switching unit that is provided between the laser light source and the laser microscopes and switches a supply destination of a laser beam among the plurality of laser microscopes by changing a beam splitter to be arranged on an incident optical axis. Each of the laser microscopes includes an optical axis adjustment unit that adjusts an optical axis of the laser beam, and a control unit that controls the optical axis adjustment unit based on identification information about the beam splitter arranged on the incident optical axis.

Microscope system including a laser source, a plurality of laser microscopes, and an optical path switching unit to switch a supply destination of a laser from the laser source

A scanning optical microscope includes a light source, a light converging optical system, a stage, a scanning unit which displaces an illumination light and the stage relatively, a detecting optical system, and a photodetector. A light modulation element and a relay optical system are disposed on the light converging optical system side of the light source, and a modulated signal having only amplitude changed is input to the light modulation element, and the light modulation element is positioned such that the illumination light emerged from the light modulation element with respect to the modulated signal of a predetermined amplitude coincides with an optical axis of the light converging optical system, and a position of a pupil of the light converging optical system and a position of the light modulation element are conjugate through at least the relay optical system.

Scanning optical microscope

The present invention is low cost, does not exert a negative influence on the surroundings, has a small group-velocity delay dispersion, efficiently blocks reflected return light such that the laser light does not return to the laser light source, and allows properly polarized laser light to enter a polarization-dependent element in a subsequent stage. An optical device is provided which includes a laser light source, an optical system that transmits laser light emitted from the laser light source, and a polarization-dependent element into which the laser light transmitted by the optical system enters. The characteristics of outgoing light are changed according to a polarization state of the incident light. The optical system includes a reflected-light generator that reflects a part of the transmitted laser light, and &#x3bb;/4 wave plates are disposed such that the reflected-light generator is disposed therebetween.

Optical device and laser microscope

A microscope apparatus that can observe into the interior of a specimen and that can apply an optical stimulus over a wide area within a short period of time is provided. The microscope apparatus comprises at least one observation scanning optical system including a laser light source for emitting observation laser light, an objective lens, and a scanning optical system for two-dimensionally scanning the observation laser light in a predetermined examination plane of the specimen via the objective lens; and at least one stimulus optical system which includes a lamp light source for emitting light having a wavelength used for optical stimulation and which irradiates the specimen with the light emitted from the lamp light source.

Microscope apparatus

It is possible to achieve a required field number and numerical aperture for microscope observation at a scanning speed equal to video-rate or higher and also to change the scanning speed with a simple configuration. The invention provides a laser microscope including a laser light source; a scanning unit configured to scan a specimen with laser light emitted from the laser light source; and an objective lens configured to focus the laser light scanned by the scanning unit on the specimen. The scanning unit is provided with an electro-optical deflecting element including an electro-optical crystal in which a refractive index gradient is induced by injecting electric current.

Laser microscope and control method for the same

A multiphoton-excitation laser scanning microscope capable of efficiently collecting fluorescence emitted from a specimen to acquire a brighter multiphoton-excitation fluorescence image is provided. This multiphoton-excitation laser scanning microscope includes a multiphoton-excitation laser light source for emitting ultrashort pulsed laser light, a light-scanning unit configured to scan a specimen with the ultrashort pulsed laser light emitted from the multiphoton-excitation laser light source in two dimensions, an objective lens configured to focus the ultrashort pulsed laser light scanned by the light-scanning unit on the specimen, a collector lens disposed opposite the objective lens, with the light-scanning unit disposed therebetween, to collect fluorescence emitted from the specimen, and a light detector configured to detect the fluorescence collected by the collector lens. The collector lens has a higher numerical aperture and a larger field number than the objective lens.

Multiphoton-excitation laser scanning microscope

A clear fluorescence image is easily obtained irrespective of variation of scattering due to variation of the depth of a focus position in a specimen. A scanning optical device includes a laser light source for emitting laser light, a scanning unit for scanning the laser light emitted from the laser light source on the specimen, a focus depth adjusting unit for adjusting the depth of the focus position in the specimen of the laser light to be scanned, a fluorescence detector for detecting fluorescence generated from the focus position of the laser light in the specimen, a reference depth information storage unit for storing the absolute height of a predetermined reference depth of the focus position of the laser light in the specimen by the focus depth adjusting unit, and a hardware setting storage unit for storing the relative height to the absolute height of the reference depth at each focus position of the laser light and at least one set value of the laser light source, the scanning unit, and the fluorescence detector in association with each other.

Scanning optical device which sets hardware in association with a depth of a focus position based on hardware set values stored in association with depths of focus positions

The invention provides a multiphoton-excitation observation apparatus comprising a light-source unit for emitting pulsed laser light; an observation apparatus main unit for irradiating a specimen with laser light emitted from the light-source unit and observing fluorescence emitted from the specimen; an incidence adjusting device, disposed between the light-source unit and the observation apparatus main unit, for adjusting the beam diameter of the laser light emitted from the light-source unit; and a control apparatus for controlling the incidence-adjusting unit according to the depth of an observation plane in the specimen.

Multiphoton-excitation observation apparatus

A laser scanning microscope includes an acousto-optic element or an electro-optic element in an illumination optical system which introduces a laser beam from a laser beam source of the laser scanning microscope into a microscope. The laser scanning microscope further includes a beam expander disposed between the laser beam source and the acousto-optic element or the electro-optic element.

Growing community of inventors

Nagano, Japan

Makio Ueno